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Application of a Flatbed Transparency Scantier as an XRD Scanning Densitometer

Published online by Cambridge University Press:  06 March 2019

J. P. Heuer ,
J. P. Fernandez ,
R. L. Lewis  and
C. G. Cleaver
J. P. Heuer
Affiliation:
General Electric Company Vallecitos Nuclear Center P. O. Box 460, M. C.V08 Pleasanton, CA 94566
J. P. Fernandez
Affiliation:
General Electric Company Vallecitos Nuclear Center P. O. Box 460, M. C.V08 Pleasanton, CA 94566
R. L. Lewis
Affiliation:
General Electric Company Vallecitos Nuclear Center P. O. Box 460, M. C.V08 Pleasanton, CA 94566
C. G. Cleaver
Affiliation:
General Electric Company Vallecitos Nuclear Center P. O. Box 460, M. C.V08 Pleasanton, CA 94566
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Extract

The days of Debye-Scherrer film as a recording medium for X-ray powder patterns are all but gone with the development of precise, high sensitivity diffractometer systems. However, film does present some advantages over diffractometry (digital positioning and recording) for certain applications, A scanning densitometer system is described which totally automates the analysis of Debye-Scherrer film. It is much more precise and more capable than the simple line readers available in the past and can reduce the analysis time of complicated patterns from hours to minutes.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 433 - 439
Copyright
Copyright © International Centre for Diffraction Data 1993

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References

1. Storms, H.A., X-ray Diffraction Analysis of Small Samples, Proceedings of the 9th Pacific Conference on Applied Spectroscopy, October 6-9 1970.Google Scholar
2. DataScan is available from Materials Data Inc., P. O. Box 791, Livermore, CA 94551-0791.Google Scholar
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