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An X-Ray Micro-Fluorescence Analysis System With Diffraction Capabilities

Published online by Cambridge University Press:  06 March 2019

M. C. Nichols  and
R. W. Ryon
M. C. Nichols
Affiliation:
Materials Science Dept. Sandia Natl. Laboratory Livermore, California
R. W. Ryon
Affiliation:
Non- Destructive Evaluation Section Lawrence Livermore Natl. Laboratory Livermore, California
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Abstract

A prototype X-ray fluorescence system for chemical and phase microanalysis of materials has been developed and tested. Preliminary work with this system has indicated X-ray fluorescence detection limits on the order of 40 picograms for heavier elements such as gold when using a 100 micron collimator, 400 second counting time and a silver anode operating at 12 Kw. Phase identification by X- ray diffraction can be obtained from the same spot. A proposed design for an improved system providing greater elemental sensitivities and capable of semi-automated operation has been completed.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 29: Thirty-Fourth Annual Conference on Applications of X-ray Analysis, August 5-9, 1985 , 1985 , pp. 423 - 426
Copyright
Copyright © International Centre for Diffraction Data 1985

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References

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