The present study investigated the anisotropy in the orientation of particles in synthetic swelling clay media prepared from the sedimentation of particle-sized fractions of vermiculite. The different size fractions (<0.1, 0.1–0.2, 1–2, and 10–20 μm) were chosen because they represent the wide range of particle sizes of swelling clay minerals encountered in natural environments. Small-angle neutron scattering (SANS) and neutron diffraction measurements allowed the characteristic scattering/diffraction features to be derived and the quantitative information about the particle orientation distributions along two directions with respect to the sedimentation plane to be extracted. The results obtained confirmed that the increase in particle size was associated with the development of a random orientation for the particles, whereas the hydration state had a negligible impact on the organization of the porous media. For finer vermiculite particles, the rocking curves demonstrated an anisotropy of the systems that is similar to those reported previously on natural montmorillonite minerals. This result suggests that the location of the layer charge has little or no impact on the anisotropy features of particle orientation. For the coarsest fraction (10–20 μm), quantitative information about the particle orientation revealed that the relative proportion of the isotropic contribution represents up to 85% of the material. The anisotropy in the 2D SANS patterns revealed a pore-network anisotropy that was consistent with the particle size.

The crystallite size distribution is an important parameter affecting the processing and properties of materials or products containing crystallites. The X-ray diffraction pattern collected with a two-dimensional detector may contain one or several spotty diffraction rings when an appropriate X-ray beam size is used. The spottiness of the diffraction ring is related to the size, size distribution, and orientation distribution of the crystallites. The intensity of a diffraction spot may represent its volume or size of a crystallite when a perfect Bragg condition is met. This paper introduces the algorithms and procedure to evaluate crystallite size distribution from a 2D diffraction pattern by rocking scan.

The deflection (curvature) of embedded single-crystal silicon chips was investigated by rocking curve X-ray diffraction techniques at two significant manufacturing stages in the process chain of printed circuit boards with embedded components. An overview of the curvature deduction by two different approaches was presented: (1) the measurement of the variation of the rocking curve maximum as a function of the lateral sample position along a specific traverse; the slope in such a diagram is then proportional to the corresponding curvature in that direction. (2) The evaluation of the rocking curve width; here the peak width is inversely proportional to the curvature at known beam diameter, diffraction angle, and beam divergence. It was shown that the rocking curve method is applicable to determine the curvature inside single crystalline chips. Furthermore, the method is also suitable to determine the curvature of fully embedded or encapsulated chips. Additionally the absorption of the radiation in the embed medium was quantitatively discussed. The curvature of two different prepared samples was determined at temperatures up to 200 °C in a heating stage attached to the diffractometer device.