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Novel Super-Fast Three-Dimensional SEM Image Simulation
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 796-797
- Print publication:
- August 2013
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Artificial SEM Images for Testing Resolution-Measurement Methods
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 910-911
- Print publication:
- August 2008
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Scanning Electron and Ion Microscope-based Size and Shape Metrology at the Nanometer Scale
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 118-119
- Print publication:
- August 2008
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