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Reference Material (RM) 8820: A New Scanning Electron Microscope Scale Calibration Artifact
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 668-669
- Print publication:
- July 2009
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Artificial SEM Images for Testing Resolution-Measurement Methods
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 910-911
- Print publication:
- August 2008
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Scanning Electron and Ion Microscope-based Size and Shape Metrology at the Nanometer Scale
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 118-119
- Print publication:
- August 2008
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