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MTW-OPAL: a technology development platform for ultra-intense optical parametric chirped-pulse amplification systems
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- Journal:
- High Power Laser Science and Engineering / Volume 9 / 2021
- Published online by Cambridge University Press:
- 06 October 2021, e63
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X-ray Analysis of Si/Ge/Si(001) Heterolayer Structures Grown by Surfactant Mediated Epitaxy.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 696 / 2001
- Published online by Cambridge University Press:
- 17 March 2011, N4.9
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- 2001
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Analysis of the Dimerized Sb/Si(001)-(2×l) Surface by X Ray Standing Waves
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- MRS Online Proceedings Library Archive / Volume 375 / 1994
- Published online by Cambridge University Press:
- 15 February 2011, 121
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- 1994
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Surface Roughness and Correlation Length Determined from X-Ray Diffraction Line Shape Analysis on Germanium (111)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 143 / 1988
- Published online by Cambridge University Press:
- 21 February 2011, 215
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- 1988
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