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Challenges to Quantitative Multivariate Statistical Analysis of Atomic-Resolution X-Ray Spectral
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue 4 / August 2012
- Published online by Cambridge University Press:
- 31 July 2012, pp. 691-698
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- August 2012
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Chemical Mapping at the Atomic Level using Energy Dispersive X-ray Spectroscopy
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 598-599
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- July 2011
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Comparison of the Detection Limits of EDS and EELS in S/TEM
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1312-1313
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- July 2010
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Sub-nanometer Resolution in Field-free Imaging using a Titan 80-300 with Lorentz lens and Image Cs-Corrector at 300kV Acceleration Voltage
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 184-185
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- July 2009
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An integrated Silicon Drift Detector System for FEI Schottky Field Emission Transmission Electron Microscopes
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 208-209
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- July 2009
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Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit
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- Microscopy and Microanalysis / Volume 14 / Issue 5 / October 2008
- Published online by Cambridge University Press:
- 16 September 2008, pp. 469-477
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- October 2008
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Design of an Analytical TEM/STEM with 0.3 srad EDX Detection
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 704-705
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- August 2005
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