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TEM Specimen Preparation for Integrated Circuits - Challenges and Solutions
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 06 August 2003, pp. 154-155
- Print publication:
- August 2003
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Transmission Electron Microscopy Applications in the Semiconductor Industry - Challenges and Solutions for Specimen Preparation
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 180-181
- Print publication:
- August 2002
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Precision TEM Specimen Preparation for Integrated Circuits using Dual-Beam FIB Lift-Out Technique
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 516-517
- Print publication:
- August 2000
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