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Vendor Directory: Product and Services Listing

Published online by Cambridge University Press:  19 June 2008

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Microscopy and Microanalysis , Volume 14 , Supplement S1 , August 2008 , pp. 161 - 168
Copyright
Copyright © Microscopy Society of America 2008

Accessories (miscellaneous)

Applied Image, Inc.—710

DiATOME U.S.—811

Duniway Stockroom Corp.—715

Electron Microscopy Sciences—813

Fischione Instruments—424

Siskiyou Corporation—418

Ted Pella, Inc.—703

The McCrone Group, Inc.—827

Vibration Engineering Consult.—608

Anti-Contamination Systems

Fischione Instruments—424

XEI Scientific, Inc.—720

Atomic Force Microscopes

(See Scanning Probe Microscopes)

Automated/Robotic Equipment

Omniprobe, Inc.—922

Backscatter Detectors

Energy Beam Sciences Inc.—822

SPI Supplies—803

Tescan USA, Inc.—330

Books

McCrone Research Institute

MSA Megabooth—130

Camera/Digital Camera Systems

4pi Analysis, Inc.—1022

Advanced Microscopy Techniques Corp.—704

Buehler Ltd.—506

Direct Electron, LP—420

Gatan, Inc.—1130

JENOPTIK Systeme GmbH—712

Leica Microsystems, Inc.—430

Olympus Soft Imaging System

Ted Pella, Inc.—703

Tietz Video and Image Processing Systems GmbH—224

CCD Cameras

(See Cameras/Digital Camera Systems)

CMOS Cameras

(See Cameras/Digital Camera Systems)

Cold Sputtering Equipment

Energy Beam Sciences Inc.—822

Ernest F. Fullam, Inc.—619

Ted Pella, Inc.—703

Confocal Microscopes

Leica Microsystems, Inc.—430

Consulting

McCrone Research Institute

The McCrone Group, Inc.—827

Vibration Engineering Consultants—608

Courses/Workshops

Hitachi High Technologies America, Inc.—1329

McCrone Research Institute

MSA Megabooth—130

Ted Pella, Inc.—703

The McCrone Group, Inc.—827

Cryoequipment

Attocube Systems AG—823

DiATOME U.S.—811

Electron Microscopy Sciences—813

Energy Beam Sciences Inc.—822

Leica Microsystems, Inc.—430

Crystallographic Mapping

EDAX, Inc.—104

Oxford Instruments America, Inc.—620

Databases

International Centre for Diffraction Data (ICDD)—623

MSA Megabooth—130

Detectors

4pi Analysis, Inc.—1022

Bruker AXS Microanalysis—1109

e2v scientific instruments ltd.—614

EDAX, Inc.—104

Fischione Instruments—424

MAX Detector Repair Group LLC

Oxford Instruments America, Inc.—620

SII Nanotechnology USA Inc.—126

Tescan USA, Inc.—330

Diamond Knives

Delaware Diamond Knives, Inc.—713

DiATOME U.S.—811

Micro Star Technologies

Ted Pella, Inc.—703

Diamond Wire Saws

Delaware Diamond Knives, Inc.—713

Electron Microscopy Sciences—813

Digital Archiving/Data Storage

JENOPTIK Systeme GmbH—712

Leica Microsystems, Inc.—430

Mirero, Inc.

Dual Beam FIB/SEM

ETS-Lindgren—220

FEI Company—528

Hitachi High Technologies America, Inc.—1329

JEOL USA, Inc.—1027

Omniprobe, Inc.—922

Tescan USA, Inc.—330

Vibration Engineering Consultants—608

E Beam Lithography

Applied Image, Inc.—710

ETS-Lindgren—220

JEOL USA, Inc.—1027

Tescan USA, Inc.—330

Vibration Engineering Consultants—608

EDS Detector Repairs and Upgrades

4pi Analysis, Inc.—1022

Bruker AXS Microanalysis—1109

e2v scientific instruments ltd.—614

MAX Detector Repair Group LLC

Oxford Instruments America, Inc.—620

PulseTor LLC—329

Electrical Characterization

EDAX, Inc.—104

Electron Backscattered Diffraction (EBSD)

EDAX, Inc.—104

International Centre for Diffraction Data (ICDD)—623

Lehigh University Microscopy School

Oxford Instruments America, Inc.—620

SEMTech Solutions, Inc.

Electron Microprobes/EPMA

Advanced MicroBeam, Inc.—604

JEOL USA, Inc.—515

Lehigh University Microscopy School

Electron Microprobe Automation Systems

Advanced MicroBeam, Inc.—604

Geller MicroÅnalytical Laboratory

Electron Microprobe Service

Advanced MicroBeam, Inc.—604

Geller MicroÅnalytical Laboratory

Vibration Engineering Consultants—608

EMI Cancellation

Vibration Engineering Consultants—608

Failure Analysis

Hitachi High Technologies America, Inc.—1329

MAX Detector Repair Group LLC

Mirero, Inc.

Norsam Technologies, Inc.—333

Omniprobe, Inc.—922

Sela USA, Inc.—722

FIB Accessories

Omniprobe, Inc.—922

Field Emission Sources

(See Filaments)

Filaments and Filament Rebuilding

Electron Microscopy Sciences—813

Energy Beam Sciences Inc.—822

Ted Pella, Inc.—703

Xradia, Inc.—726

Filters

(See Optical Filters)

Fluorescence Microscopy

JENOPTIK Systeme GmbH—712

Leica Microsystems, Inc.—430

Nanonics Imaging Ltd.

SII Nanotechnology USA Inc.—126

Siskiyou Corporation—418

The McCrone Group, Inc.—827

Focused Ion Beam Systems/Workstations

FEI Company—528

Hitachi High Technologies America, Inc.—1329

Micro Optics of Florida

Norsam Technologies, Inc.—333

FT-IR Microscopy

Thermo Fisher Scientific—834

Image Analysis and Processing

Buehler Ltd.—506

Gatan, Inc.—1130

Hitachi High Technologies America, Inc.—1329

HREM Research, Inc.—1325

JENOPTIK Systeme GmbH—712

Leica Microsystems, Inc.—430

Mirero, Inc.

Rap-ID US—437

Tietz Video and Image Processing Systems GmbH—224

Immuno-Labeling

Electron Microscopy Sciences—813

Ted Pella, Inc.—703

Ion Pumps New and Rebuilding

Duniway Stockroom Corp.—715

Journals

Cambridge University Press—828

MSA Megabooth—130

Scanning2008/FAMS, Inc.

Knives

Delaware Diamond Knives, Inc.—713

DiATOME U.S.—811

Electron Microscopy Sciences—813

Leica Microsystems, Inc.—430

Minitool

Knife Resharpening

DiATOME U.S.—811

Electron Microscopy Sciences—813

Micro Star Technologies

LaB6 Sources

(See Filaments)

Light Microscopes

Buehler Ltd.—506

Labx

Leica Microsystems, Inc.—430

McCrone Research Institute

Micro Optics of Florida

Siskiyou Corporation—418

The McCrone Group, Inc.—827

Megapixel Cameras

(See Cameras/Digital Camera Systems)

Metallography Equipment

Buehler Ltd.—506

Ted Pella, Inc.—703

Micromanipulators

Attocube Systems AG—823

Minitool

Omniprobe, Inc.—922

Oxford Instruments America, Inc.—620

Siskiyou Corporation—418

Microtomes and Ultramicrotomes

Leica Microsystems, Inc.—430

Micro Star Technologies

Microtome Repair Service

(See Service & Repair)

Microwave Tissue Processing

Electron Microscopy Sciences—813

Leica Microsystems, Inc.—430

Ted Pella, Inc.—703

Nano Indentation

Attocube Systems AG—823

Micro Star Technologies

Nanonics Imaging Ltd.

SEMTech Solutions, Inc.

Nanopositioners

Attocube Systems AG—823

Omniprobe, Inc.—922

Nanoprobes/Mechanical Microprobes

Hitachi High Technologies America, Inc.—1329

Micro Star Technologies

Oxford Instruments America, Inc.—620

Xradia, Inc.—726

New and Used Equipment

Advanced MicroBeam, Inc.—604

FEI Company—528

Labx

Tescan USA, Inc.—330

Optical Filters

Applied Image, Inc.—710

Osmium Coaters

SPI Supplies—803

Phase Identification

Bruker AXS Microanalysis—1109

EDAX, Inc.—104

International Centre for Diffraction Data (ICDD)—623

Photography Supplies

Electron Microscopy Sciences—813

Ted Pella, Inc.—703

Plasma Cleaners

Electron Microscopy Sciences—813

Fischione Instruments—424

SPI Supplies—803

XEI Scientific, Inc.—720

Publishers

ASM International—331

Cambridge University Press—828

Raman Spectroscopy/Microscopy

Labx

Nanonics Imaging Ltd.

Rap-ID US—437

Thermo Fisher Scientific—834

Reference Materials/Reference Standards

Applied Image, Inc.—710

Geller MicroÅnalytical Laboratory

SPI Supplies—803

Ted Pella, Inc.—703

Resharpening Services

(See Knife Resharpening)

Sample Preparation and Handling

Buehler Ltd.—506

Delaware Diamond Knives, Inc.—713

DiATOME U.S.—811

Electron Microscopy Sciences—813

Ernest F. Fullam, Inc.—619

Fischione Instruments—424

Gatan, Inc.—1130

JEOL USA, Inc.—515

Leica Microsystems, Inc.—430

Luxel—508

M.E. Taylor Engineering, Inc.

Micro Optics of Florida

Minitool

Norsam Technologies, Inc.—333

Omniprobe, Inc.—922

Sela USA, Inc.—722

Siskiyou Corporation—418

Ted Pella, Inc.—703

Scanning Electron Microscopes

ETS-Lindgren—220

FEI Company—528

Hitachi High Technologies America, Inc.—1329

JEOL USA, Inc.—515

Labx

Lehigh University Microscopy School

McCrone Research Institute

Mirero, Inc.

Novelx, Inc.—607

Sela USA, Inc.—722

Tescan USA, Inc.—330

SEM/STEM Digital Imaging Systems

4pi Analysis, Inc.—1022

Direct Electron, LP—420

Hitachi High Technologies America, Inc.—1329

Lehigh University Microscopy School

SEMTech Solutions, Inc.

Tietz Video and Image Processing Systems GmbH—224

SEM Accessories

Advanced Microscopy Techniques Corp—704

Attocube Systems AG—823

Energy Beam Sciences Inc.—822

Ernest F. Fullam, Inc.—619

ETS-Lindgren—220

Fischione Instruments—424

Gatan, Inc.—1130

M.E. Taylor Engineering, Inc.

Nanonics Imaging Ltd.

Omniprobe, Inc.—922

Protochips, Inc.—610

SEMTech Solutions, Inc.

Tescan USA, Inc.—330

Vibration Engineering Consultants—608

XEI Scientific, Inc.—720

Scanning Probe Microscopes

Attocube Systems AG—823

Lehigh University Microscopy School

Nanonics Imaging Ltd.

Xradia, Inc.—726

Scanning Tunneling Microscopes

(See Scanning Probe Microscopes)

Service & Repair

MAX Detector Repair Group LLC

Tescan USA, Inc.—330

Vibration Engineering Consultants—608

Service Laboratories

Advanced MicroBeam, Inc.—604

Geller MicroÅnalytical Laboratory

M.E. Taylor Engineering, Inc.

Screen Recoating

Electron Microscopy Sciences—813

Software

Gatan, Inc.—1130

Hitachi High Technologies America, Inc.—1329

HREM Research, Inc.—1325

International Centre for Diffraction Data (ICDD)—623

JENOPTIK Systeme GmbH—712

MSA Megabooth—130

Probe Software, Inc.—318

  • 541-343-3400

  • probesoftware.com

Tietz Video and Image Processing Systems GmbH—224

Spectrometers

Bruker AXS Microanalysis—1109

e2v scientific instruments ltd.—614

Parallax Research—929

Rap-ID US—437

Thermo Fisher Scientific—834

Xradia, Inc.—726

Stage Automation

Advanced Microscopy Techniques Corp—704

Mirero, Inc.

Stereoscopic Viewing Systems

Leica Microsystems, Inc.—430

Supplies

Duniway Stockroom Corp.—715

Electron Microscopy Sciences—813

SPI Supplies—803

Ted Pella, Inc.—703

Surface Profiling

Ernest F. Fullam, Inc.—619

SEMTech Solutions, Inc.

Surface Analysis

Geller MicroÅnalytical Laboratory

JEOL USA, Inc.—1027

Labx

Leica Microsystems, Inc.—430

Thermo Fisher Scientific—834

TEM Accessories

Advanced Microscopy Techniques Corp—704

DiATOME U.S.—811

ETS-Lindgren—220

Fischione Instruments—424

Luxel—508

Protochips, Inc.—610

Tietz Video and Image Processing Systems GmbH—224

Vibration Engineering Consultants—608

Testing Equipment

Applied Image, Inc.—710

Minitool

Rap-ID US—437

Transmission Electron Microscopes

ETS-Lindgren—220

FEI Company—528

Hitachi High Technologies America, Inc.—1329

JEOL USA, Inc.—515

Luxel—508

Sela USA, Inc.—722

Ultramicrotomes

(See Microtomes & Ultramicrotomes)

Vacuum Evaporators

Electron Microscopy Sciences—813

Ted Pella, Inc.—703

Vacuum Equipment

Attocube Systems AG—823

Duniway Stockroom Corp.—715

Electron Microscopy Sciences—813

Ernest F. Fullam, Inc.—619

Vibration Isolation Systems

Minus K Technology

Technical Manufacturing Corporation—510

Video Systems

Rap-ID US—437

X-ray Analysis Equipment

4pi Analysis, Inc.—1022

Bruker AXS Microanalysis—1109

e2v scientific instruments ltd.—614

EDAX, Inc.—104

Luxel—508

MAX Detector Repair Group LLC

Oxford Instruments America, Inc.—620

Parallax Research—929

PulseTor LLC—329

SII Nanotechnology USA Inc.—126

Thermo Fisher Scientific—834

Xradia, Inc.—726