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S154 Invited—Improved Sensitivity From Multiple Images in Residual Stress Measurement By ESPI Hole-Drilling

Published online by Cambridge University Press:  20 May 2016

G. S. Schajer  and
M. Steinzig
G. S. Schajer
Affiliation:
University of British Columbia, Vancouver, BC, Canada
M. Steinzig
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM
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Abstract

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Type
DENVER X-RAY CONFERENCE
Information
Powder Diffraction , Volume 23 , Issue 2 , June 2008 , pp. 184
Copyright
Copyright © Cambridge University Press 2008

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