Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-23T15:49:16.692Z Has data issue: false hasContentIssue false
  • English
  • Français

D058 Determination of local strain field in SOI lines using high resolution X-ray diffraction

Published online by Cambridge University Press:  20 May 2016

A. Loubens ,
M. Gailhanou ,
O. Thomas ,
J.-S. Micha ,
R. Fortunier  and
B. Charlet
A. Loubens
Affiliation:
Université Paul Cézanne, Marseille, France Ecole Nationale Supérieure des Mines de Saint-Etienne, Gardanne, France
M. Gailhanou
Affiliation:
Université Paul Cézanne, Marseille, France
O. Thomas
Affiliation:
Université Paul Cézanne, Marseille, France
J.-S. Micha
Affiliation:
CEA-Grenoble/DRFMC/SI3M/PCM, Grenoble, France
R. Fortunier
Affiliation:
Ecole Nationale Supérieure des Mines de Saint-Etienne, Gardanne, France
B. Charlet
Affiliation:
CEA Leti, Grenoble, France
Get access Rights & Permissions [Opens in a new window]

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 21 , Issue 2 , June 2006 , pp. 184
Copyright
Copyright © Cambridge University Press 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)