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Corrosion of Electronic and Magnetic Devices and Materials

Published online by Cambridge University Press:  10 February 2011

Gerald S. Frankel
Gerald S. Frankel*
Affiliation:
The Fontana Corrosion Center, The Ohio State University, 477 Watts Hall, 2041 College Rd., Columbus, OH 43210, [email protected]
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Abstract

Corrosion of thin film structures commonly used in electronic and magnetic devices is discussed. Typical failure modes are presented, and galvanic corrosion is discussed in some detail since it is one common problem with such devices. A graphical explanation for the determination of the ohmic potential drop during galvanic corrosion is presented. The corrosion problem of thin film disks is shown to have changed during the past ten years owing to changes in disk structure. The corrosion susceptibility of two antiferromagnetic alloys used for exchange coupling to soft magnetic layers is discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 451: Symposium P – Electrochemical Synthesis and Modification , 1996 , 541
Copyright
Copyright © Materials Research Society 1997

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References

REFERENCES

1. Frankel, G. S., in Corrosion Mechanisms in Theory and Practice, edited by Marcus, P. and Oudar, J., Marcel Dekker, New York, 1995, pp. 547–580,.Google Scholar
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3. Kinoshita, K., Carbon. Electrochemical and Physiochemical Properties, John Wiley and Sons, New York, 1988, pp. 86–93.Google Scholar
4. Brug, J. A., Anthony, T. C., and Nickel, J. H., MRS Bulletin, 21, pp23–27, (1996).Google Scholar