Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-23T08:56:48.807Z Has data issue: false hasContentIssue false

Properties of Transparent Conductive Oxide Films on Flexible Substrates

Published online by Cambridge University Press:  26 February 2011

Shih Hsiu Hsiao
Affiliation:
[email protected], Kyoto University, Mechanical Engineering and Science, Yoshida-Honmachi, Sakyo-ku, Kyoto, 606-8317, Japan, 81-75-753-5257
Yoshikazu Tanaka
Affiliation:
[email protected], Kyoto University, Mechanical Engineering and Science, Kyoto, 606-8317, Japan
Ari Ide-Ektessabi
Affiliation:
[email protected], Kyoto University, International Innovation Center, Kyoto, 606-8317, Japan
Get access

Abstract

Transparent conductive oxide (TCO) thin films are extensively used in display industry and they can be utilized for flexible displays. The polymer and the plastic materials used as flexible substrates are more bendable and lighter weight compared to glass substrates. However, its mechanical and surface properties differed from glass substrates result in different quality of TCO layers deposited on it. In this study, Polyethylene Terephthalate (PET) and glass were used as substrates. Indium Tin Oxide (ITO), Zinc Oxide (ZnO), Mg-doped ZnO (MZO), Al-doped ZnO (AZO), Ga-doped ZnO (GZO), Al-doped MZO (AMZO), Ga-doped MZO (GMZO) were used as TCO materials deposited by RF sputtering. Rutherford Backscatter Spectroscopy (RBS) and X-Ray Diffraction (XRD) were used to analyze the chemical composition and crystal structure of TCO thin films. Light transmittance and surface resistivity were measured after the different deposited conditions. , Mg-, Al-, Ga- doped ZnO indeed modified the optical properties of ZnO and better than ITO. However, the electrical conductivity was not improved obviously compared to ITO when they deposited on PET substrate at room temperature.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Sieber, I., Wanderka, N., Urban, I., Dorfel, I., Schierhorn, E., Fenske, F., Fuhs, W., Thin Solid Films, 330, 108113, (1998)Google Scholar
2. Matsubara, K., Tampo, H., Shibata, H., Yamada, A., Fons, P., Iwata, K., Niki, S., Apply. Phys. Letter, 85, 1374 (2004)Google Scholar
3. Chen, M., Pei, Z. L., Sun, C., Wen, L. S., Wang, X., J. Cryst. Growth, 220, 254262, (2000)10.1016/S0022-0248(00)00834-4Google Scholar
4. MacDonald, William A., Journal of Materials Chemistry, 14, 410, (2004)Google Scholar
5. Bhattacharya, P., Das, R. R., Katiyar, R. S., Thin Solid Films, 447–448, 564567, (2004)Google Scholar
6. Lide, David R, “Handbook of Chemistry and Physics”, 12–8 (1992)Google Scholar
7. Haacke, G., Journal of Applied Physics, 47, 9, 40864089 (1976)10.1063/1.323240Google Scholar