Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-29T10:05:54.804Z Has data issue: false hasContentIssue false
  • English
  • Français

Microstructural Characterization of Sol-Gel Derived Lead Titanate Deposited On Silica

Published online by Cambridge University Press:  21 February 2011

Joseph M. Schwartz ,
Lorraine Falter Francis  and
Lanny D. Schmidt
Joseph M. Schwartz
Affiliation:
University of Minnesota, Department of Chemical Engineering and Materials Science, Minneapolis, MN 55455
Lorraine Falter Francis
Affiliation:
University of Minnesota, Department of Chemical Engineering and Materials Science, Minneapolis, MN 55455
Lanny D. Schmidt
Affiliation:
University of Minnesota, Department of Chemical Engineering and Materials Science, Minneapolis, MN 55455
Get access

Abstract

The microstructural evolution of lead titanate prepared by a sol-gel method was examined using transmission electron microscopy (TEM) following treatments in air at progressively higher temperatures. TEM specimens were prepared by spin coating a film or dispersing particles onto specimen grids coated with SiO2 or SiO2 with a barrier layer. The effects of different barrier materials, thermal treatment conditions, and the addition of platinum particles were examined. Lead titanate formed crystalline perovskite at ∼550-600°C on all support materials examined. On SiO2 supports, the pyrochlore phase formed at lower temperatures and converted partially to perovskite at higher temperatures. Barrier layers of TiO2, A12O3 and polyimide prevented pyrochlore formation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 310: Symposium N – Ferroelectric Thin Films III , 1993 , 281
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Rou, S. H., Graettinger, T. M., Chow, A. F., Soble, S. N., Lichtenwalner, D. J., Auciello, C., and Kingon, A. I. in Ferroelectric Thin Films II, edited by Kingon, A. I., Myers, E. R., and Tuttle, B. A. (Mater. Res. Soc. Proc. 243, Pittsburgh, PA, 1992) pp. 81–91.Google Scholar
2. Takahaski, Y., Matsuoka, Y., Yamaguchi, K., Matsuki, M., and Kobayashi, K., J. Mater. Sci., 25, 3960 (1990).Google Scholar
3. Goosey, M. T., Patel, A., Whatmore, R. W., and Ainger, F. W., Brit. Ceram. Proc., 41, 49 (1989).Google Scholar
4. Schwartz, J. M. and Schmidt, L. D., J. Catal. 138, 283 (1992).Google Scholar
5. Budd, K. D., Dey, S.K., and Payne, D. A., Brit. Ceram. Proc., 36, 107 (1985).Google Scholar
6. Martin, F. W., Phys. and Chem. of Glasses, 6 (4), 143 (1965).Google Scholar
7. Wright, J. S. and Francis, L. F., J. Mater. Res., in pressGoogle Scholar
8. Chen, J., Udayakumar, K. R., Brooks, K. G., and Cross, L. E., J. Appl. Phys. 71 (9), 4465 (1992).Google Scholar
9. Schwartz, J. M., Wright, J. S., Francis, L. F., Schmidt, L. D., in preparation.Google Scholar
10. Parikh, N. R., Stephen, J. T., Swanson, M. L., and Myers, E. R. in Ferroelectric Thin Films, edited by Myers, E. R. and Kingon, A. I. (Mater. Res. Soc. Proc. 200, Pittsburgh, PA, 1990) pp. 193–198.Google Scholar
11. Madsen, L. D. and Weaver, L., J. Elec. Mater., 21 (1), 93 (1992).Google Scholar