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Defect-Mediated Growth of YBa2Cu3O7-δ Films

Published online by Cambridge University Press:  25 February 2011

D. G. Schlom ,
D. Anselmetti ,
J. G. Bednorz ,
Ch. Gerber  and
J. Mannhar
D. G. Schlom
Affiliation:
The Pennsylvania State University, Department of Materials Science and Engineering, University Park, PA 16802
D. Anselmetti
Affiliation:
University of Basel, Institute of Physics, Klingelbergstrasse 82, CH-4056 Basel, Switzerland
J. G. Bednorz
Affiliation:
IBM Research Division, Zurich Research Laboratory, CH-8803 Rüschlikon, Switzerland
Ch. Gerber
Affiliation:
IBM Research Division, Zurich Research Laboratory, CH-8803 Rüschlikon, Switzerland
J. Mannhar
Affiliation:
IBM Research Division, Zurich Research Laboratory, CH-8803 Rüschlikon, Switzerland
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Abstract

The evolution of the surface microstructure of sputtered c-axis oriented epitaxial YBa2Cu3O7-δ films has been monitored by scanning tunneling microscopy (STM). The results indicate that growth is dominated by the incorporation of depositing species at defect sites. These defect sites, which provide energetically favorable positions for accommodating the arriving species, are at ledges—either along growth spirals emanating from screw dislocations, or due to the closely spaced surface steps arising from the macroscopic tilt of the substrate. If the substrate is misoriented sufficiently, the depositing species may diffuse to and be accommodated by these surface steps, without the supersaturation on the terraces attaining a high enough level for two-dimensional nucleation to occur. Under these conditions, growth occurs by step propagation. Otherwise, a high density of screw dislocations (≈109 cm-2) is nucleated during the initial stages of growth, which provides a continual supply of ledge incorporation sites in the vicinity of the depositing species. The surface evolution reported appears to be an intrinsic feature of c-axis oriented YBa2Cu3O7-δ films for a wide range of growth conditions, irrespective of the substrate material or vapor phase deposition method.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 280: Symposium B – Evolution of Surface and Thin Film Microstructure , 1992 , 341
Copyright
Copyright © Materials Research Society 1993

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References

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