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Volume 24 - March 2016

Contents

Page 2 of 6

Surface Analysis

  • Introduction to Special Issue on Advances and Applications of Surface Analysis Methods

  • Donald R. Baer
  • Published online by Cambridge University Press:
    18 March 2016, pp. 12-15
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  • Abstract: Introduction to the special issue on surface analysis, providing thumbnail sketches of several popular techniques. A table gives the capabilities of each technique.

Company Profile

  • PCO AG

  • Published online by Cambridge University Press:
    10 March 2016, p. 6
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Feature Article

  • Preservation of Triceratops horridus Tissue Cells from the Hell Creek Formation, MT

  • Mark H. Armitage
  • Published online by Cambridge University Press:
    08 January 2016, pp. 18-23
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Scanning Probe Microscopy

Secondary Electron Microscopy

  • Secondary Electron Imaging in an Aberration-Corrected STEM

  • D. R. G. Mitchell, G. Casillas
  • Published online by Cambridge University Press:
    09 September 2016, pp. 22-27
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Electron Microscopy

Light Microscopy

  • Color as a Standardized Variable in Brightfield Microscopy

  • Daryl L. Goad
  • Published online by Cambridge University Press:
    17 June 2016, pp. 16-21
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Company Profile

  • Phenom-World

  • Published online by Cambridge University Press:
    10 March 2016, p. 7
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Electron Microscopy

Surface Analysis

  • Secondary Ion Mass Spectrometry Imaging of Tissues, Cells, and Microbial Systems

  • Christopher R. Anderton, Lara J. Gamble
  • Published online by Cambridge University Press:
    18 March 2016, pp. 24-31
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Electron Microscopy

  • Enabling Lab-in-Gap Transmission Electron Microscopy at Atomic Resolution

  • Xiao Feng Zhang
  • Published online by Cambridge University Press:
    08 January 2016, pp. 24-29
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  • Abstract: Hitachi Lab-in-Gap transmission electron microscopy (TEM) technologies are introduced. The term Lab-in-Gap refers to a special function that allows in situ and in operando TEM studies of materials in gas or liquid environments while stimulations, such as thermal or electrical fields, are applied to the specimen sitting in the pole piece gap in a TEM system. Physical or chemical process can be activated and imaged in real time using TEM or other imaging modes. The new generation environmental TEM platform with large pole piece gap and advanced aberration correctors opens wide possibilities for integrating multiple stimuli sources as well as large-area, sub-Å resolution live imaging for dynamic structural changes.

Light Microscopy

  • Emerging LED Technologies for Fluorescence Microscopy

  • Kavita K. Aswani
  • Published online by Cambridge University Press:
    17 June 2016, pp. 22-27
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  • Fluorescence microscopy has employed mercury arc lamps for decades because of their high power and broad spectrum. Fluorophores and filter sets have been developed around the peaks of the spectrum offered by these lamps. When LEDs first entered the fluorescence microscopy arena, prices were high and output was low, but in recent years there have been significant advancements in LED capabilities for microscopy. This article aims to educate users of fluorescence microscopy about the benefits of LEDs compared to conventional mercury arc lamps.

Scanning Probe Microscopy

Secondary Electron Microscopy

Surface Analysis

Company Profile

  • Zeiss

  • Published online by Cambridge University Press:
    10 March 2016, pp. 8-9
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Light Microscopy

  • Light Microscopy Analysis of Bone Response to Implant Surfaces

  • Jae-Hyuk Sim, In-Sung Yeo*
  • Published online by Cambridge University Press:
    17 June 2016, pp. 28-33
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Scanning Probe Microscopy

Focused Ion Beam Technology

Page 2 of 6