The primary function of an SEM specimen stage is to optimize the orientation of the specimen to the signal detectors. The ease and precision with which the stage executes this function determine its utility to the microscopist. While the majority of scanning electron microscopes are equipped with general purpose five-axis specimen stages, a six-axis stage can significantly enhance specimen orientation. Specimen manipulation can be further simplified by incorporation of a six-axis hand controller that enables the microscopist to move the specimen intuitively as if the specimen were held directly in the hand.

SEM manufacturers typically install general purpose five-axis specimen stages in their scanning electron microscopes. In addition to translation along the X and Y axes, these stages are capable of tilt (T), elevation (Z motion), and rotation (R). Tilt directs the specimen surface toward the secondary electron detector to optimize signal collection. Elevation adjusts the working distance while rotation orients specific image features within the picture frame.

As an industrial consulting laboratory specializing in small particle, thin film, and surface analysis, instrumental techniques to solve problems involving contamination, failure analysis, processing control, and materials research are used on a daily basis. In many cases, elemental analysis for samples is sufficient to pinpoint problems and suggest solutions. However, some cases require a more detailed understanding of chemical states and phases in small particles and films than that typically obtained from light and electron microscopy and x-ray microanalysis.

The chemical states and phases in crystalline particles and thick films can be analyzed with several techniques found in many laboratories, including polarized light microscopy, x-ray diffraction, and electron diffraction. In combination with elemental analysis, these techniques oftentimes provide a very detailed understanding of the chemistry of particles and films.

In 1946 Indiana U. purchased an electron microscope sight unseen for $600, deciding it was an EM. on the basis of weight. Seeing Dr. Fischer's ad far an assistant, I wondered what an E.M, was. I dashed upstairs to find his office. Having come directly from the airport where I was a pilot. I was dirty and needed a shave. I planned to come back when I had cleaned up. I put my nose against the door to read his small handwriting and office hours. Out he came. We hung together nose to nose as he asked, “Did you want something?” “Poor time to tell you no,” I responded. I got the job in spite of my appearance because, as he told me, I knew photography, could learn the panel on an airplane and wasn't afraid of work. We put the microscope together and it ran! We set up a summer lab course, but he asked me to teach it when he got a sabbatical.