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Castaing's Electron Microprobe and its Impact On Materials Science

Published online by Cambridge University Press:  14 March 2018

Dale E. Newbury*
Affiliation:
National Institute of Standards and Technology

Extract

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A central theme of modern materials science has been the exploration of the relationship between the microstructure of a material and its macroscopic properties. Beginning in the late 19th century, the developing field of metallography permitted scientists to view the microstructure of metal alloys. Mechanical polishing followed by selective chemical etching produced differential relief on chemically distinct phases or at grain boundaries. With such specimens, reflection optical microscopy revealed structures with micrometer and even finer dimensions. The microstructural world that was found proved to be highly complex, and most alloys were observed to be chemically differentiated into two or more distinct phases.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2000

References

Notes

1. Castaing, R. and Guinier, A., Proc. 1st Intl. El. MicrosCong., Delft, (1949)60-63.Google Scholar
2. Marion, L., ed., the First National Conference on Electron Probe Microanalysis, College Park, Maryland (1966).Google Scholar
3. Shunk, F.A., Constitution of Binary Alloys, 2nd Suppl., McGraw-Hill, New York (1969).Google Scholar
4. Cosslett, V.E. and Duncumb, P., Nature, 177(1956)1172,Google Scholar
5. Oatley, C.W., The Scanning Electron Microscope, Part 1: The Instrument, Cambridge Univ. Press (1972).Google Scholar
6. Goldstein, J.I. et al., Scanning Electron Microscopy and X-ray Microanalysis, Plenum, New York (1992).Google Scholar
7. Miyake, G.T. and Goldstein, J.I., Geochim et Cosmochim Acta, 38(1974)1201.Google Scholar
8. Romig, A.D. Jr., and Goldstein, J.I., Microbeam Analysis - 1979, San Francisco Press (1979)124.Google Scholar
9. Bastin, G.F. and Heijligers, H.J., Microscopy and Microanalysis, 4, suppl. 2 (1998) 220.CrossRefGoogle Scholar