Microscopy and Microanalysis: Volume 9 -

Only show content I have access to (795)

Over 3 years (1138)

Biological Applications (8)

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 9 - August 2003

Abstract

Strain Measurements at a NiSi/Si Interface Using STEM-CBED: A Quantifaction Method for Stress Relaxation During TEM Lamella Preparation

Transmission Electron Microscopy Study of a New Compound in the System Sm-Mn-Ge-O

FIB Dual-Beam Sample Preparation for TEM Observation

Focused Ion Beam Preparation Techniques for EFTEM Analysis

In-Situ Low Energy Ion Milling with a FIB-SEM for TEM lift-out Sample Preparation of Copper Damascene Structures Fabricated with Low k porous SiLKTM Semiconductor Dielectric

FIB-TEM Characterization Of Surface And Sub-Surface Defects Introduced Into Lithium Niobate By A Femtosecond Laser

Localised Charging Effects Induced In Nonconductive Materials During Focused Ion Beam Milling

Application of FIB to Metal Alloy TEM Sample Preparation

Advances in Broad Ion Beam Processing for 3D Microscopy and Microanalysis of Ceramic Composites

Surface Damage In Silicon After 30 Kev Ga Fib Fabrication

Applications of Focused Ion Beam Using FEI DualBeam DB235: How Deep Is How Small a Hole? & How to Drill It Deeper & Smaller?

Preparation of Transmission Electron Microscope Specimens from Ultra-Fine Fibers by a FIB Technique

Grazing Incidence X-ray Optics for Wavelength Dispersive Spectrometers in Micro-Analysis

Performance of a high count rate silicon drift x-ray detector on the anl 300 kv advanced analytical electron microscope.

A New High Energy-resolution Soft-X-ray Spectrometer for A Transmission Electron Microscope

The Right Tool For Low Energy X-Ray Microanalysis

Correlating Deformation Mechanisms with Mechanical Properties in Freestanding Thin Metallic Films

In-Situ Nanoindentation – A Unique Probe Of Deformation Response In Materials

Sealed Environmental Cell Microscopy

In-Situ Video-STM Studies of the Quasi-Collective Motion of Nanoscale Metal Strings in Au(100) Electrode Surfaces

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 9 - August 2003

Abstract