Microscopy and Microanalysis: Volume 9 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 9 - August 2003

Abstract

Atomistic Modeling of the Detailed Structure of Si/SiO2 Interfaces Using AIDATEM (Ab-initio Interface Defect detection by Analytic Transmission Electron Microscopy)

The Giant Core Hole Effect in Electron Energy Loss Spectroscopy

The Effect of Oxygen on the Electronic Structure of MgB2

Improving Energy Resolution of EELS Spectra by Deconvolution using Maximum-Entropy and Richardson-Lucy Algorithms

Comparative Electron Energy-Loss Near-Edge Fine Structure Investigations Of Titanium Oxides

High Resolution Spectrometer Coupling to the Sub-Å IBM STEM

Determination of U-oxidation states in the brannerite structure by electron energy-loss (EELS), x-ray photoelectron (XPS) and diffuse reflectance (DRS) spectroscopies.

Design and First Results of SESAM

The Oxygen K edge in Strontium Titanate and Lanthanum Titanate

Investigation of Local Electronic, Dielectric and Optical Properties of Individual Composite Tabular AgX Emulsion Microcrystals by Cryo-EELS and LMTOASA Techniques

Experiencies and Possibilities with a 200 kV Monochromated (S)TEM

Relative contrast in a-Si and c-Si in ADF-STEM imaging

Insights into Degradation Mechanisms and Vacancy Ordering in BaTiO3

Atomic-Resolution EELS in Aberration-Corrected STEM

EELS Characterization of Tin Oxides

Identification of Microphases: New Databases for Electron Diffraction

The Nature of Precession Electron Diffraction Data

Strain Analysis of InxGa(1-x)N/GaN Films by CBIM Toward Quantification

Phase Identification by Selected Area Electron Diffraction

Sucrose Is A Good Alternative Sustain To Protect Protein Structure For Electron Crystallography

Microscopy and Microanalysis

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Volume 9 - August 2003

Abstract