Microscopy and Microanalysis: Volume 9 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 9 - August 2003

Abstract

Exit-Surface Dependency of Defocus measured by Off-axis Electron Holography

Interference of Inelastically Scattered Electrons by DBI/H Experiments

Collection and Characteritzation of Ultra-Fine Airborne Particulates

Structural Study by High Resolution Transmission Electron Microscopy of Zirconia Nanoclusters.

Fractal Logic Applied to Micro-grained Textures Characterization

Estimation of Temperature Rise During Ion Milling of Samples

Comparison of Different Sample Preparation Techniques in TEM Observation of Microstructure of INCONEL alloy 783 Subjected to Prolonged Isothermal Exposure

Advances in Sample Preparation of Semiconductor Devices for Electron Microscopy

Preparation of Cross-sectional Samples of Proton Exchange Membrane Fuel Cells for TEM Characterization

Recent Developments in Automated Sample Preparation for FESEM

Tin Whiskers – A Recurring Industrial Problem Examined With Electron Microscopy

Patterned Wheels for Faster Dimpling and Improved Specimen Preparation

Low Damage Sample Preparation of Semiconductor Materials Using Low Energy Ion Milling

Specimen Preparation Considerations for 2D Dopant Profile Determination in Semiconductor Devices by Electron Holography

Oxygen Segregation and Electronic Structure Changes at Dislocations in GaN

Measuring Non-uniformities in GaN/AlN Quantum Wells

Atomic Resolution Z-contrast Imaging and EELS: Application for Ge/SiO2 Interface

Electron Energy Loss Spectroscopy of CeO2-x Nanoparticles

Nanoscale Analysis of Complex Oxide Interfaces

Measuring the Hole State Anisotropy in MgB2 by High-Resolution Angular-Resolved Electron Energy-Loss Spectroscopy

Microscopy and Microanalysis

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Volume 9 - August 2003

Abstract