Microscopy and Microanalysis: Volume 23 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Nanomechanical Characterization of Materials using Microscopy and Microanalysis Techniques

Abstract

An Analysis of Nanoindentation in a NiCoAlFeMo High Entropy Alloy Produced by Sintering

Effect of Ti and W Additions on the Microstructural Behavior of a Nanocrystalline CoCrFeMoNi High Entropy Alloy

Mechanical Behavior on Microstructure of B4C Particles Reinforced 2024 Aluminum Matrix Composite Obtained by Mechanical Milling

Microstructure and Superconductivity of Bi/Ni bilayers Prepared by Pulsed Laser Deposition

Correlated EBSD and High Speed Nanoindentation Mapping

In Situ Study of High-Temperature Mechanical Properties of Carbon Nanotube Scaffolds

TEM Study of Polycrystalline Co-Ni-Ga for Applications of Shape Memory Alloys

Study of Nanostructured NiCrMo Base Alloy Coatings Applied via LVOF Thermal Spray

Microstructural Characterization of Inconel 718 for Aeronautical Use

Influence of Salt Fluxes on Recycled Al Nanocomposites Reinforced with TiO2 Nanoparticles Produced in Liquid State

Improved Understanding of Material Behavior using Correlative In-situ Techniques

Comparative Study between Vickers and Knoop Micro-hardness of Ultra High Temperature Ceramics

In Situ Study of Mechanical Testing and Fracture Process of Glassy Polystyrene Grafted Nanoparticle Assembly: Impact of Film Thickness and Strain Rate

Technique for In-situ Meso-Scale Uniaxial Mechanical Testing in the SEM

Low-cost Functionalized Pseudoboehmite/Aluminum Substrates for the Analysis of Nanoparticles by SEM

Pushing the Limits of Cryo-TEM: Development and Applications

Abstract

Detection of Isolated Metal Ions on Ferritin by Single-Particle Cryo-STEM Reconstruction

Dose-Efficient Cryo-STEM Imaging of Whole Cells Using the Electron Microscope Pixel Array Detector

Cryo-STEM Tomography with Inpainting

Electron Beam Sources using InGaN Semiconductor Photocathodes for Single-shot Imaging Electron Microscope

New Strategies for Improving CryoEM Single Particle Analysis in EMAN2.2

Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Nanomechanical Characterization of Materials using Microscopy and Microanalysis Techniques

Abstract

Pushing the Limits of Cryo-TEM: Development and Applications

Abstract