Microscopy and Microanalysis: Volume 23 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Anniversary Session: Instrumentation of Atom Probe: 50 Years and Counting

Abstract

Field Emission Microscopy to Study the Catalytic Reactivity of Binary Alloys at the Nanoscale.

Enabling Atom Probe Analyses of New Materials Classes with Vacuum-Cryo-Transfer Capabilities

The Pulsed-Laser Atom Probe: A Review of Its Development and Initial Applications

Evolution of Atom Probe Data Collection Toward Optimized and Fully Automated Acquisition

On the Multiple Event Detection in Atom Probe Tomography

Simplifying Observation of Hydrogen Trapping in Atom Probe Tomography

Applications, Technical Challenges, and Recent Implementation of a UHV/Cryogenic Specimen Transfer System for Atom Probe Tomography

Interlaboratory Study: Laser-assisted Atom Probe Tomography (APT) of a Phosporous-Doped Silicon Specimen

Nanoscale Chiral Recognition Using Field Ion and Field Emission Microscopy

Laser-Induced Reversion of δ′ precipitates in an Al-Li Alloy

Reconstruction, Simulations, and Data Analysis in Atom Probe Tomography

Abstract

Correlating Irradiation-Induced Solute Clustering with Changes of Hardness in Low and High Flux Reactor Pressure Vessel Steels

Exploring Artifact Signals in Atom Probe Mass Spectra

Field Evaporation Behavior of Ternary Compound Semiconductor InxAli-xN

Recent Reconstruction Developments in IVAS

Reconstructing APT Datasets: Challenging the Limits of the Possible

High Fidelity Reconstruction of Experimental Field Ion Microscopy Data by Atomic Relaxation Simulations

Atomistic Simulations of Surface Effects Under High Electric Fields

Coupling Molecular Dynamics and Finite Element Simulations to Investigate the Nearest Neighbor Dependence of Field Evaporation

Atomic Level Studies of Step Dynamics in Homogeneous Crystal Growth

First-principles calculation of field evaporation and surface diffusion on BCC Fe (001)

Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Anniversary Session: Instrumentation of Atom Probe: 50 Years and Counting

Abstract

Reconstruction, Simulations, and Data Analysis in Atom Probe Tomography

Abstract