Microscopy and Microanalysis: Volume 23 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Advances in Scanning Electron Microscopy: Transmission Modes and Channeling Effects

Abstract

Applications of Electron Channeling Contrast Imaging (ECCI) in Failure Analysis of In-Situ Synchrotron X-Ray Diffraction Deformation Experiments

Non-destructive Imaging of Extend Defects in III-nitride Thin film Structures Using Electron Channelling Contrast Imaging

Focused Ion Beam (FIB) based Tomography of Dislocations Using Electron Channeling Contrast Imaging (ECCI)

Investigating Defect Contrast in GeXSh1-x/Si Epitaxial Structures Using Electron Channeling Contrast Imaging

High-Contrast Visualization of Anti-Phase Domains and Screw Dislocations in 3C-SiC

Rapid Nanometer Mapping of Nickel-Steel Friction Stir Weld Joint

Effects of Ultrasonic Welding on Nanocrystalline Ag-W Investigated with 30 kV Transmission Kikuchi Diffraction (tKD) and 300 kV STEM SE Imaging

Effect of Ni Addition on Microstructure and Hardness of A356 Alloy after Hot Plastic Deformation

Synthesis and Characterization of Mg Obtained by Mechanical Alloying and Doped with Al2O3 and Y2O3

10kfps Transmission Imaging in a 196 Beam SEM

Measurement of Vortex Beam Phase by Electron Holography

Development of a Fountain Detector for Spectroscopy of Secondary Electrons in SEM

Non-Diffractive Electron Bessel Beams for Scanning Electron Microscopy in Transmission Mode Using Direct Phase Masks

Applications of Forward Modeling to Refinement of Grain Orientations

EBSD - a Powerful Tool for the Analysis of Magnetic Materials

2015 NIST Workshop on Analytical Transmission Scanning Electron Microscopy

On Mass-Thickness Contrast in Annular Dark-Field STEM-in-SEM Images

Revised Algorithm for Image Sharpness Measurement in Scanning Electron Microscopy Based on Derivative Method in ISO/TS 24597 Document

Anniversary Session: Instrumentation of Atom Probe: 50 Years and Counting

Abstract

A Personal Retrospective on the Origin of the Time-of-Flight Atom Probe

My Life with Erwin: The Beginning of an Atom-Probe Legacy

Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Advances in Scanning Electron Microscopy: Transmission Modes and Channeling Effects

Abstract

Anniversary Session: Instrumentation of Atom Probe: 50 Years and Counting

Abstract