Microscopy and Microanalysis: Volume 23 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Materials Characterization using Atomic-Scale EDX/EELS spectroscopy

Abstract

STEM SI Warp: a Digital Micrograph script tool for warping the image distortions of atomically resolved spectrum image

Simplifying Electron Beam Channeling in STEM

Layer Count Mapping of Multilayer Hexagonal Boron Nitride Thin Films

Determining the Electron Density and Volume Expansion at Grain Boundaries Using Electron Energy-Loss Spectroscopy

Microstructural Characterization of Hardened AISI 4140 using CrN/CSi Coatings

Advances and Applications of Aberration-Corrected Electron Microscopy

Abstract

Applications of High Precision STEM Imaging to Structurally Complex Materials

Mapping Picometer Scale Periodic Lattice Distortions with Aberration Corrected Scanning Transmission Electron Microscopy

Atomic Resolution Imaging of YAlO3:Ce in the Chromatic and Spherical Aberration Corrected PICO Transmission Electron Microscope

Three-Dimensional Point Defect Imaging by Large-angle Illumination STEM

Atomap - Automated Analysis of Atomic Resolution STEM Images

Aberration-Corrected STEM/EELS at Cryogenic Temperatures

Direct Solid-State Nucleation From Preexisting Coherent Precipitates in Aluminium

Evaluation of Aberration-corrected Optical Sectioning for Exploring the Core Structure of ½[111] Screw Dislocations in BCC Metals

Quantitative Mapping of Strain, Polarization, and Octahedral Distortion at unit cell resolution by Scanning Electron Diffraction

Towards a Direct Visualization of Charge Transfer in Monolayer Hexagonal Boron Nitride using a Fast Pixelated Detector in the Scanning Transmission Electron Microscope

Enhanced Resolution from Full-Field Ptychography with an Electron Microscope Pixel Array Detector

Quantitative Relation Between Differential Phase Contrast Images Obtained by Segmented and Pixelated Detectors

Quantitative Specimen Electric Potential Maps Using Segmented and Pixel Detectors in Scanning Transmission Electron Microscopy

Theory and Practice of Diffractometry on Single Tungsten Atoms using Electron Microscope Pixel Array Detectors

Imaging of Individual Vacancies Using Electron Channeling Contrast in STEM

Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Materials Characterization using Atomic-Scale EDX/EELS spectroscopy

Abstract

Advances and Applications of Aberration-Corrected Electron Microscopy

Abstract