Microscopy and Microanalysis: Volume 23 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Bridging Length Scales with 2D, 3D, and 4D Multiscale/Multimodal Microscopy

Abstract

In situ Mechanical Studies of Plastic Bonded Explosive, Multiscale 3D Imaging and Modeling

Correlative 3D Imaging and Characterization of Human Dentine

Correlative Microscopy in 3D: Recent Advancements in Multi-Scale Materials Science

Correlated Electron Microscopy across Length Scales to Elucidate Structural, Electrical and Chemical Properties of Oxide Grain Boundaries

A Novel Strategy to Effectively Characterize FinFET Device by Multidirectional Comprehensive Analytical TEM in Semiconductor Wafer-foundries

Cross-scale Integrated Biomaging by 3D Light-, X-ray and Electron Microscopy - From Organisms, Organs and Tissue to Cells, Organelles and Macromolecular Complexes

Integrated Dynamic 3D Imaging of Microbial Processes and Communities in Rhizosphere Environments: The Argonne Small Worlds Project

Correlative Tomography for Additive Manufacturing of Biomedical Implants

Dissecting the Cellular Behaviour of Colorectal Cancer via Multimodal Imaging and Correlative Microscopy

Electron Ptychography: From 2D to 3D Reconstructions

Symmetry-Breaking Nanoregions in Single-Phase High Entropy Alloys Determined using Scanning Convergent Beam Electron Diffraction

Multiscale Microstructural Analysis of Austempered Ductile Iron Castings

3D Nanotomography of Porous Polymer Composite using FIB/HIM and FIB/SEM

Accelerating 3D Microstructure Acquisition via Fully Automated Serial Sectioning

A Robust 3D Scanning Technique for SEM

Correlative Imaging of Murine Pulmonary Valve Extracellular Matrix

eC-CLEM: Flexible Multidimensional Registration Software for Correlative Microscopies with Refined Accuracy Mapping

Development of an Efficient Methodology for the Mapping and Digital Analysis of 3D Surfaces via SEM

Materials Characterization using Atomic-Scale EDX/EELS spectroscopy

Abstract

Understanding Properties of Functional Materials with Atomic-Resolved Electron Energy Loss Spectroscopy

Enhanced Sensitivity of Atomic-Resolution Spectroscopic Imaging by Direct Electron Detection

Microscopy and Microanalysis

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Volume 23 - October 2017

Analytical and Instrumentation Science Symposia

Bridging Length Scales with 2D, 3D, and 4D Multiscale/Multimodal Microscopy

Abstract

Materials Characterization using Atomic-Scale EDX/EELS spectroscopy

Abstract