Physical Sciences Symposia
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Complex Dielectric Function and Optical Properties for the Perovskite BCZT via VEELS–STEM.
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- 30 July 2021, pp. 588-589
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Bandgap and Complex Dielectric Function from the Low-Loss Energy Spectrum for SnO2 Prismatic Nano-Rods.
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- 30 July 2021, pp. 590-591
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Vibrational Spectroscopy of Beam-Sensitive Materials in the Transmission Electron Microscope
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- 30 July 2021, pp. 592-594
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Correcting STEM distortions in atomically resolved elemental maps
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- 30 July 2021, pp. 596-598
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Combining ADF-EDX scattering cross-sections for elemental quantification of nanostructures
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- 30 July 2021, pp. 600-602
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Towards quantitative elemental mapping across interfaces by combining momentum-resolved STEM and EDX
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- 30 July 2021, pp. 604-607
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Intrinsic Helical Twist and Chirality in Ultrathin Tellurium Nanowires
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- 30 July 2021, pp. 608-609
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Optimizing STEM Optics for EELS of Amorphous and Crystalline Materials in Semiconductors
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- 30 July 2021, pp. 610-611
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The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements
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- 30 July 2021, pp. 612-615
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Emerging Opportunities in STEM to Characterize Soft-Hard Interfaces
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- 30 July 2021, pp. 616-618
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How many detector pixels do we need for super-resolution ptychography?
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- 30 July 2021, pp. 620-622
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Study of sodium metal plasmon using electron energy loss spectroscopy
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- 30 July 2021, pp. 624-625
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High-Throughput Intelligent Analysis of High and Low-Loss EELS
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- 30 July 2021, pp. 626-628
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In-Situ Spectrum Imaging with Synchronized and Automated Stimulus Control
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- 30 July 2021, pp. 630-632
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Emerging Low-Dimensional Nanomaterials and Their Heterostructures
Commissioning and Calibration of a Photoemission Electron Microscope
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- 30 July 2021, p. 634
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Correlative Electron Microscopy Enables Scalable Characterization of 2D half-van der Waals Heterostructures
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- 30 July 2021, pp. 636-638
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Atomic Scale Investigation of Interfaces in MoS2-ReS2 In-plane Heterostructures Using High Resolution S/TEM
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- 30 July 2021, pp. 640-641
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Characterisation and Defect Analysis of 2D Layered Ternary Chalcogenides
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- 30 July 2021, pp. 642-643
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Atomic Study on Defects in 2D PtSe2 Monolayers Using Electron Microscopy
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- 30 July 2021, pp. 644-645
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Investigation of Oxide Phases of MoS2: van der Waals Epitaxially Formed α-MoO3 on MoS2
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- 30 July 2021, pp. 646-647
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