Microscopy and Microanalysis: Volume 25 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - June 2019

Physical Science Symposia

In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies

Developing Multifunctional and High Resolution In-situ TEM Holders

In Situ Analytical Electron Microscopy and Cryogenic Electron Microscopy for Characterizing Nanoscale Materials in Electrochemical Process

Investigation of the Oxidation Reaction of LiFePO4 Cathode Material using Environmental TEM

Facile in situ Lithiation and Sodiation Observation in TEM Employing MF (M=Li, Na)

In Situ Electron Microscopy for Electrically Induced Charge Transport and Phase Transformation

In situ S/TEM Heating Experiments to Study the Effects of Cyclic Thermal Gradients in Additive Manufacturing Build Processes

In situ Atomic Scale Observation of Cu2O Reduction Under Methanol

TiO2 Phase Transformation Mechanisms at Atomic Scale under Heating and Electron Beam Irradiation

Self-Healing of a Confined Phase Change Memory Device with a Metallic Surfactant Layer

In situ Observation of Oxygen Vacancy Order-Disorder Transition in NdBaCo2O5.5 Layered Perovskite Oxide

Tracking Metastable Phase Selection during Devitrification in a Metallic Glass

High Resolution S/Transmission Electron Microscopy Investigation of Ca3Mn2O7 Phase Transformation under In-situ Heating Condition

Advanced and In-Situ Electron Microscopy Investigation of Phase Composition and Phase Transformation in Ga-Rh Liquid Metal Catalysts

Nanoscale Deformation Processes Revealed in Nacre of Pinna nobilis Mollusk Shells

Investigating Ferroelectric Domain and Domain Wall Dynamics at Atomic Resolution by TEM/STEM in situ Heating and Biasing

In situ STEM Mechanical Experiments at Atomic-Resolution Using a MEMS Device

Tilted Fluctuation Electron Microscopy Characterization of Magnetically Anisotropic Amorphous Metal Films

The in situ Studies on the Anomalous Domain Switching Caused by Trace Amount of Oxygen Vacancies

In situ Transmission Electron Microscopy Annealing for Crystallization and Phase Stability Studies in the Ga2O3-In2O3 System

Understanding the Slip Planarity and Residual Strain Field in Ti-6Al using Nanobeam Electron Diffraction and First Principles Calculations

Microscopy and Microanalysis

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Volume 25 - June 2019

Physical Science Symposia

In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies