Microscopy and Microanalysis: Volume 25 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - June 2019

Physical Science Symposia

Theory and Applications of Electron Tomography in the Materials Sciences

4D Atomic Electron Tomography

Data Acquisition in 4D Atomic Electron Tomography

Characterisation and Categorisation Strategies for Anisotropic Gold Nanoparticles for Applications in Biology

Towards Routine EDX Tomography in Semiconductor Failure Analysis

Structure-dependent Conducting Properties of Phosphonated Polypeptoid Electrolyte Membranes Revealed by Cryogenic Electron Tomography

Shape Determination in Lithium-Ion Battery Cathode Materials Using Electron Diffraction-Assisted Electron Tomography

Three-dimensional Analysis of Non-stained Polymer Alloy Using Differential Phase Contrast-STEM Tomography

In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies

In-situ TEM on Formation of Monatomic Metallic Glasses Through Ultrafast Liquid Quenching

Electric Field-Induced Surface Melting of Gold Observed In Situ at Room Temperature and at Atomic Resolution Using TEM

In situ TEM Investigation of the Electroplasticity Phenomenon in Metals

Microstructure and Defect Characterization Using Advanced STEM Techniques: 4D-STEM and WB DF STEM

Differential Phase Contrast Imaging of the Magnetostructural Transition and Phase Boundary Motion in Uniform and Gradient-doped FeRh-based Thin Films

In Situ Ferroelectric Domain Dynamics Probed with Differential Phase Contrast Imaging

Real-Space Observation of a Transformation from Antiskyrmion to Skyrmion by Lorentz TEM

Correlation of Structural Modifications by Multiscale Phase Mapping in Filamentary Type HfO2-based RRAM: Towards a Component Specific in situ TEM Investigation

In situ Electric Field Manipulation of Ferroelectric Vortices

Mapping Ferroelectricity in Hafnia Thin Films with STEM EBIC

Direct Observation of Field-induced Modulation of Two-dimensional Electron Gas at Oxide Interfaces

Atomic Resolution Probing of Phase Transformations and Domain Evolution During Large Superelastic Deformation in Ferroelectrics with in situ TEM

Unraveling the Relationship Between Layer Stacking and Magnetic Order in Nb3X8 Systems via Controlled-Temperature Cryo-STEM

Microscopy and Microanalysis

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Volume 25 - June 2019

Physical Science Symposia

Theory and Applications of Electron Tomography in the Materials Sciences

In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies