Microscopy and Microanalysis: Volume 25 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - June 2019

Physical Science Symposia

Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope

Sub-nm Spectroscopic Mapping of Highly Beam Sensitive Species Using Direct Detection Electron Energy Loss Spectroscopy

STEM and Elemental Analysis by EDS and EELS for Two-dimensional Atomic Structure Containing Au and Cu

Nanoscale Correlative Imaging of Low-Z elements by in-situ Secondary Ion Mass Spectrometry in a Transmission Electron Microscope

Monolayer-like Behavior of Bilayer Transition-Metal Dichalcogenides

Graphite Nanoplatelets in Elastomer Composites

A Case-Study of Bubble Formation Mechanism by Analytical TEM during Evaluation of an Incoming Spin-On-Hardmask at Wafer-Foundries

Analysis of Elemental Composition of Fe1−xNix and Si1−xGex Alloy Thin Films by EPMA and μ-XRF

HAADF-STEM Study of Filament Material in Hot Filament CVD Diamond Films

Synthesis and Analysis Microstructural of CeO2 Nanoparticles Using Chelating Agents

Hydrothermal Synthesis of Nanohybrid Gr-CeO2

Microstructural, Structural and Mechanical Behavior of WC-Based Hardmetals Bonded with High and Medium Entropy Alloys.

Raman Characterization of LiNbO3 Nanofibers Doped with Mn

Energy Dispersive X-ray Spectroscopic Analysis of Al-Cu-Fe Quasicrystalline Thin Film Layer

Correlative STEM and SEM Imaging of PTB7:PC71BM-Based Photoactive Layers in a Scanning Electron Microscope

Theory and Applications of Electron Tomography in the Materials Sciences

3D Electron Ptychography

Engineering Chiral Structures Through Strain Release: Electron Tomography Study of Twisted Nanowires

Reconstruction of Projected and 3D Magnetization Distributions from Electron-Optical Phase Images using an Iterative Model-Based Algorithm

Quantification of 3D Atomic Structures and Their Dynamics by Atom-Counting from an ADF STEM Image

Defining Theoretical Limits of Aberration-Corrected Electron Tomography: New Bounds for Resolution, Object Size, and Dose

STEM/EDS Tomography of Cometary Dust

Microscopy and Microanalysis

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Volume 25 - June 2019

Physical Science Symposia

Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope

Theory and Applications of Electron Tomography in the Materials Sciences