Microscopy and Microanalysis: Volume 10 -

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Volume 10 - August 2004

Contents

Page 17 of 48

Interfaces: A Symposium in Honor of Manfred Rühle

Research Article

Characterization of Ultra-Thin Hf-based Alternative Dielectric Layers for Si CMOS by Z-contrast Imaging and Electron Energy-Loss Spectroscopy in STEM
Melody P Agustin, Brendan Foran, Gennadi Bersuker, Joel Barnett, Susanne Stemmer
Published online by Cambridge University Press:

01 August 2004, pp. 322-323
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Effect of Micro-twins on InSb Quantum Wells Grown on GaAs (001) Substrates
T.D. Mishima, D.A. Blom, J.C. Keay, N. Goel, M.A. Ball, S.J. Chung, M.B. Johnson, M.B. Santos
Published online by Cambridge University Press:

01 August 2004, pp. 324-325
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

FEGSTEM Study of Fe-20Cr-5Al-0.046Y Model Alloy Oxidised at 1200° C
Hameed Al-Badairy, Adam J Papworth, Gordon J Tatlock
Published online by Cambridge University Press:

01 August 2004, pp. 326-327
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

The Grain Boundary Microstructure of Epitaxial La1-XSrXMnO3 (X=1/3) Films on SrTiO3 Bicrystal Substrates
Tomas Liljenfors, Robert Gunnarsson, Zdravko Ivanov, Eva Olsson
Published online by Cambridge University Press:

01 August 2004, pp. 328-329
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Atomic Scale Mapping of Phase Segregation at CMR Grain Boundaries in the Scanning Transmission Electron Microscope
Maria Varela, Vanessa Peña, Zouhair Sefrioui, Andrew R. Lupini, Jacobo Santamaria, Stephen J. Pennycook
Published online by Cambridge University Press:

01 August 2004, pp. 330-331
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Strain Accommodation During Solidification of Nanosize PbCd Inclusions Embedded in Al
Lihua H Zhang, Erik Johnson, Uli Dahmen
Published online by Cambridge University Press:

01 August 2004, pp. 332-333
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Effects of the Heteroepitaxial Interface on Spin Injection in Fe/AlGaAs
T. J. Zega, R. M. Stroud, A. T. Hanbicki, G. Kioseoglou, O. M J. van't Erve, C. H. Li, B. T. Jonker, G. Itskos, R. Mallory, M. Yasar, A. Petrou
Published online by Cambridge University Press:

01 August 2004, pp. 334-335
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Electrically Active Dislocations at the Si/GaAs Interface
Sergei Lopatin, Gerd Duscher
Published online by Cambridge University Press:

01 August 2004, pp. 336-337
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Detection of Characteristic Signals from As-Doped (less than 1 at.%) Regions of Silicon by Transmission Electron Microscopy and Convergent-beam Electron Diffraction
Masami Terauchi, Kenji Tsuda, Hajime Mitsuishi, Kazuo Kawamura
Published online by Cambridge University Press:

01 August 2004, pp. 338-339
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Characterization of Novel Nanostructures for Applications in Sensing, Nanoelectronics, and Biotechnology

Research Article

Microstructural Characterization of SnO2 Nanorods Obtained by Spray Pyrolysis
Francisco Paraguay-Delgado, Wilber Antunez-Flores, Mario Miki-Yoshida, Alfredo Aguilar-Elguezabal, Patricia Santiago, R. Diaz, Jorge A. Ascencio
Published online by Cambridge University Press:

01 August 2004, pp. 340-341
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Metal-Oxide Interface Structure in Growth of Nanowires and Nanobelts
Yong Ding, Pu Xian Gao, Zhong Lin (ZL) Wang
Published online by Cambridge University Press:

01 August 2004, pp. 342-343
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Growth and Characterization of Large Arrays of Oriented Nanostructures
J. Y Liu
Published online by Cambridge University Press:

01 August 2004, pp. 344-345
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Superstructure of Nanoparticle Assembly by HAADF-STEM
Z. Y. Li, Y. Chen, J. Yuan, R. E. Palmer, J. P. Wilcoxon
Published online by Cambridge University Press:

01 August 2004, pp. 346-347
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

HAADF and EFTEM Studies of Patterned Nanorings by Direct Electron Beam Lithography in an Iron Phosphate Glass
K. Sun, L. M. Wang, R. C. Ewing
Published online by Cambridge University Press:

01 August 2004, pp. 348-349
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

In Situ EFTEM/PEELS Investigation of Melting Behavior of Individual Al-Si Alloy Small Particles
V. P. Oleshko, J. M. Howe
Published online by Cambridge University Press:

01 August 2004, pp. 350-351
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Si Nano-Meshes Investigated Using Transmission Electron Microscopy
G. D. Lian, M. E. Curtis, P. R. Larson, K. L. Hobbs, J. C. Keay, M. B. Johnson, D. A. Blom, L. F. Allard Jr.
Published online by Cambridge University Press:

01 August 2004, pp. 352-353
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Using the Electron Microscope to Explore Reliability in Microelectromechanical Systems and Nanostructured Materials
E A Stach, Vidyut Gopal, Miao Jin, Daan Hein Alsem, Mark J. Williamson, Andrew Minor, Velimir R Radmilovic, Christopher L. Muhlstein, J. W. Morris, Robert O. Ritchie
Published online by Cambridge University Press:

01 August 2004, pp. 354-355
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Synthesis of Uniform GaN Quantum Dot Arrays via Electron Nanolithography of D2GaN3
Peter A. Crozier, John Tolle, John Kouvetakis, Cole Ritter
Published online by Cambridge University Press:

01 August 2004, pp. 356-357
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

TEM Investigation of Zn/ZnO Nanowires with Different Microstructure Synthesized by Electrodeposition
Jin-Guo Wang, Ming-Liang Tian
Published online by Cambridge University Press:

01 August 2004, pp. 358-359
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Oxidation Synthesized CuO Nanowires for Gas Sensing Applications
Katarzyna Sawicka, Mallikarjun Karadge, Arun Prasad, Pelagia I Gouma
Published online by Cambridge University Press:

01 August 2004, pp. 360-361
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Page 17 of 48

Microscopy and Microanalysis

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Volume 10 - August 2004

Interfaces: A Symposium in Honor of Manfred Rühle

Research Article

Characterization of Ultra-Thin Hf-based Alternative Dielectric Layers for Si CMOS by Z-contrast Imaging and Electron Energy-Loss Spectroscopy in STEM

Effect of Micro-twins on InSb Quantum Wells Grown on GaAs (001) Substrates

FEGSTEM Study of Fe-20Cr-5Al-0.046Y Model Alloy Oxidised at 1200° C

The Grain Boundary Microstructure of Epitaxial La1-XSrXMnO3 (X=1/3) Films on SrTiO3 Bicrystal Substrates

Atomic Scale Mapping of Phase Segregation at CMR Grain Boundaries in the Scanning Transmission Electron Microscope

Strain Accommodation During Solidification of Nanosize PbCd Inclusions Embedded in Al

Effects of the Heteroepitaxial Interface on Spin Injection in Fe/AlGaAs

Electrically Active Dislocations at the Si/GaAs Interface

Detection of Characteristic Signals from As-Doped (less than 1 at.%) Regions of Silicon by Transmission Electron Microscopy and Convergent-beam Electron Diffraction

Characterization of Novel Nanostructures for Applications in Sensing, Nanoelectronics, and Biotechnology

Research Article

Microstructural Characterization of SnO2 Nanorods Obtained by Spray Pyrolysis

Metal-Oxide Interface Structure in Growth of Nanowires and Nanobelts

Growth and Characterization of Large Arrays of Oriented Nanostructures

Superstructure of Nanoparticle Assembly by HAADF-STEM

HAADF and EFTEM Studies of Patterned Nanorings by Direct Electron Beam Lithography in an Iron Phosphate Glass

In Situ EFTEM/PEELS Investigation of Melting Behavior of Individual Al-Si Alloy Small Particles

Si Nano-Meshes Investigated Using Transmission Electron Microscopy

Using the Electron Microscope to Explore Reliability in Microelectromechanical Systems and Nanostructured Materials

Synthesis of Uniform GaN Quantum Dot Arrays via Electron Nanolithography of D2GaN3

TEM Investigation of Zn/ZnO Nanowires with Different Microstructure Synthesized by Electrodeposition

Oxidation Synthesized CuO Nanowires for Gas Sensing Applications

Microscopy and Microanalysis

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Volume 10 - August 2004

Interfaces: A Symposium in Honor of Manfred Rühle

Research Article

Characterization of Novel Nanostructures for Applications in Sensing, Nanoelectronics, and Biotechnology

Research Article