Microscopy and Microanalysis: Volume 10 -

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Volume 10 - August 2004

Contents

Page 16 of 48

Interfaces: A Symposium in Honor of Manfred Rühle

Research Article

HTREM Studies of Segregated Ga at the Al Sigma 11 (113)[11―0] Symmetrical Tilt Grain Boundary
Gunther Richter, Steffen Schmidt, Wilfried Sigle, Manfred Rühle
Published online by Cambridge University Press:

01 August 2004, pp. 282-283
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Interface Controlled Phenomena in the Cu-Al2O3 System
Christina Scheu
Published online by Cambridge University Press:

01 August 2004, pp. 284-285
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Structural Changes of Ag Single Crystals by Exposure to Hyper-thermal Atomic Oxygen
Long Li, Judith C. Yang
Published online by Cambridge University Press:

01 August 2004, pp. 286-287
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

HREM Study of Beta/Gamma Interfaces in a Water-Quenched Ti-44Al-4Nb-4Zr Alloy
Lichun C Zhang, Tai Tsui Aindow, Mark Aindow
Published online by Cambridge University Press:

01 August 2004, pp. 288-289
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Advanced Characterization of Novel Gate Stacks for Si CMOS by Scanning Transmission Electron Microscopy
Susanne Stemmer, Melody D Agustin, Yan Yang, Steffen Schmidt, Brendan Foran, Gennadi Bersuker, D G Schlom
Published online by Cambridge University Press:

01 August 2004, pp. 290-291
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

TEM Studies of Cu2O-Si and Cu2O-InP Interfaces Made by Epitaxial Electrodeposition
Fumiyasu Oba, Run Liu, Yeonseop Yu, E W Bohannan, Frank Ernst, Jay Switzer
Published online by Cambridge University Press:

01 August 2004, pp. 292-293
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Probing Local Stoichiometry in InGaN Based Quantum Wells of Solid-State LEDs
Joerg Ralf Jinschek, Sara Bals, Vidyut Gopal, Xiaoyu Xu, Christian Kisielowski
Published online by Cambridge University Press:

01 August 2004, pp. 294-295
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Atomic and Electronic Structure Analysis of Active and Inactive Diamond Grain Boundaries
Hideki Ichinose, Hidetaka Sawada, Naoki Takayanagi
Published online by Cambridge University Press:

01 August 2004, pp. 296-297
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Semiconductor Heterointerfaces Prepared by Molecular Beam Epitaxy
Achim Trampert
Published online by Cambridge University Press:

01 August 2004, pp. 298-299
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Digital Darkfield Decompositions
P. Fraundorf, Lu Fei
Published online by Cambridge University Press:

01 August 2004, pp. 300-301
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Y and Nb Grain Boundary Segregation in Polycrystalline Titanium Dioxide
Qinglei Wang, E C Dickey, Guoda Lian
Published online by Cambridge University Press:

01 August 2004, pp. 302-303
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Systematic Study of Grain Boundary Structure and Chemical Analysis of [100] and [111] Tilt Grain Boundaries in Yttria-Stabilized Zirconia
James P Buban, Katsuyuki Matsunaga, Takahisa Yamamoto, Yuichi Ikuhara
Published online by Cambridge University Press:

01 August 2004, pp. 304-305
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Polar Oxide Interfaces
V. K. Lazarov, S. A. Chambers, M. Weinert, Marija Gajdardziska-Josifovska
Published online by Cambridge University Press:

01 August 2004, pp. 306-307
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

ELNES and EDS Mapping in HfOxNy Thin Films and AlN/TiN Superlattices
Martin Couillard, M-S Lee, Dolf Landheer, Vladimir V. Pankov, Robert H. Prince, Gianluigi A. Botton
Published online by Cambridge University Press:

01 August 2004, pp. 308-309
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Local Lattice Parameter Determination of Strained Areas of Semiconductors Using CBED
Takayuki Akaogi, Kenji Tsuda, Masami Terauchi, Michiyoshi Tanaka
Published online by Cambridge University Press:

01 August 2004, pp. 310-311
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

TEM Analysis of Grain Boundary Precipitate-Free-Zones (PFZs) in AlCuSiGe Alloy
Alfredo Tolley, David Mitlin, Velimir R Radmilovic, Ulrich Dahmen
Published online by Cambridge University Press:

01 August 2004, pp. 312-313
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

On the Mechanism of Fine Lamellar Structure Formation in γ-TiAl Powders
Mallikarjun Karadge, Pelagia iren Gouma
Published online by Cambridge University Press:

01 August 2004, pp. 314-315
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

The Chemistry of Rotational Twin Boundaries in Natural ZnS
Vesna šrot, Aleksander Rěcnik, Christina Scheu, Breda Mirtič
Published online by Cambridge University Press:

01 August 2004, pp. 316-317
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

The Atomic Scale Properties of Threading Dislocations in GaN
Ilke Arslan, Andrew L. Bleloch, N. D. Browning
Published online by Cambridge University Press:

01 August 2004, pp. 318-319
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

The (01―3) Twined Nanowires of Wurtzite Structures
Yong Ding, Christopher Ma, R. Yang, Zhong Lin Wang
Published online by Cambridge University Press:

01 August 2004, pp. 320-321
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Page 16 of 48

Microscopy and Microanalysis

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Volume 10 - August 2004

Interfaces: A Symposium in Honor of Manfred Rühle

Research Article

HTREM Studies of Segregated Ga at the Al Sigma 11 (113)[11―0] Symmetrical Tilt Grain Boundary

Interface Controlled Phenomena in the Cu-Al2O3 System

Structural Changes of Ag Single Crystals by Exposure to Hyper-thermal Atomic Oxygen

HREM Study of Beta/Gamma Interfaces in a Water-Quenched Ti-44Al-4Nb-4Zr Alloy

Advanced Characterization of Novel Gate Stacks for Si CMOS by Scanning Transmission Electron Microscopy

TEM Studies of Cu2O-Si and Cu2O-InP Interfaces Made by Epitaxial Electrodeposition

Probing Local Stoichiometry in InGaN Based Quantum Wells of Solid-State LEDs

Atomic and Electronic Structure Analysis of Active and Inactive Diamond Grain Boundaries

Semiconductor Heterointerfaces Prepared by Molecular Beam Epitaxy

Digital Darkfield Decompositions

Y and Nb Grain Boundary Segregation in Polycrystalline Titanium Dioxide

Systematic Study of Grain Boundary Structure and Chemical Analysis of [100] and [111] Tilt Grain Boundaries in Yttria-Stabilized Zirconia

Polar Oxide Interfaces

ELNES and EDS Mapping in HfOxNy Thin Films and AlN/TiN Superlattices

Local Lattice Parameter Determination of Strained Areas of Semiconductors Using CBED

TEM Analysis of Grain Boundary Precipitate-Free-Zones (PFZs) in AlCuSiGe Alloy

On the Mechanism of Fine Lamellar Structure Formation in γ-TiAl Powders

The Chemistry of Rotational Twin Boundaries in Natural ZnS

The Atomic Scale Properties of Threading Dislocations in GaN

The (01―3) Twined Nanowires of Wurtzite Structures

Microscopy and Microanalysis

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Volume 10 - August 2004

Interfaces: A Symposium in Honor of Manfred Rühle

Research Article