Microscopy and Microanalysis: Volume 10 -

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Volume 10 - August 2004

Contents

Page 11 of 48

Order in Disorder: Probing the Structure of Amorphous Materials

Research Article

Different Oxide Structures Formed on Al and Si by Oxidation in Reactive Oxygen
Judith C. Yang
Published online by Cambridge University Press:

01 August 2004, pp. 82-83
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Physical Sciences Tutorial: Electron Diffaction for Modern materials Characterization

Research Article

Electron Diffraction for Modern Materials Characterization
J. M. Zuo
Published online by Cambridge University Press:

01 August 2004, pp. 84-85
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Electron Energy-Loss and X-ray Absorption Spectroscopies: Focus on Anisotropic Properties

Research Article

Detecting Structural and Bonding Changes in EELS Near-Edge Structures with a Monochromated TEM
G.A. Botton, M.-Y. Wu, C. Maunders, J. Etheridge, H.J. Whitfield
Published online by Cambridge University Press:

01 August 2004, pp. 86-87
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Magnetic Linear Dichroism in Electron Energy-Loss Spectra of alpha-Fe2O3
Peter A. van Aken, Stefan Lauterbach
Published online by Cambridge University Press:

01 August 2004, pp. 88-89
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

X-ray Absorption Near-edge and Pre-edge Structure: The Contributions of ab initio Plane-wave Pseudopotential Calculations and of Multiplet Theory
Delphine Cabaret, Emilie Gaudry, Francesco Mauri, Marie-Anne Arrio, Christian Brouder, Philippe Sainctavit, Frank de Groot
Published online by Cambridge University Press:

01 August 2004, pp. 90-91
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Theoretical and Experimental Study on Anisotropy of XANES/ELNES of Wide-Gap Materials
Teruyasu Mizoguchi, Masahiro Kunisu, Isao Tanaka, Atsutomo Nakamura, Katsuyuki Matsunaga, Takahisa Yamamoto, Yuichi Ikuhara, Wai Yim Ching
Published online by Cambridge University Press:

01 August 2004, pp. 92-93
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Quantitative X-ray Microanalysis

Research Article

Improving the Current Limits of Accuracy in Electron Probe Microanalysis of Geological Materials
John T. Armstrong
Published online by Cambridge University Press:

01 August 2004, pp. 94-95
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Nitrogen and Hydrogen in Natural Diamond, and other Stuff- Challenges of Correlative Microanalysis using Ions, Electrons and X-rays
Brendan J. Griffin, Richard Stern, Galina Bulanova, Rachael L Trautman
Published online by Cambridge University Press:

01 August 2004, pp. 96-97
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Synchrotron Radiation for the Characterization of Energy Dispersive X-ray Spectrometers
Mathias Procop, Frank Scholze
Published online by Cambridge University Press:

01 August 2004, pp. 98-99
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Theoretical Effect of Thin Films on the Detectability of Elements in the Substrate by X-Ray Microanalysis
Paula Horny, Raynald Gauvin, Eric Lifshin, Helen Campbell
Published online by Cambridge University Press:

01 August 2004, pp. 100-101
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Accessorizing the SEM

Research Article

High Resolution X-ray Microscopy in the Scanning Electron Microscope
Del Redfern, L A Brownlow, C J Sheffield-Parker, P R Miller, S. C. Mayo
Published online by Cambridge University Press:

01 August 2004, pp. 102-103
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Integrated XRF in the SEM
Brian John Cross, K C Witherspoon
Published online by Cambridge University Press:

01 August 2004, pp. 104-105
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

A Comparison of Microcalorimeter and Conventional Semiconductor EDS
Hendrix Demers, Raynald Gauvin, I M Anderson, D C Joy, E A Kenik
Published online by Cambridge University Press:

01 August 2004, pp. 106-107
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Aberration Correction, Electron Holography, High-Resolution TEM

Research Article

Performance of Monochromized and Aberration-Corrected TEMs
Gerd Benner, Erik Essers, Marko Matijevic, Alexander Orchowski, Peter Schlossmacher, Alexander Thesen, Maximilian Haider, Peter Hartel
Published online by Cambridge University Press:

01 August 2004, pp. 108-109
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

First Results from the Aberration-Corrected JEOL 2200FS-AC STEM/TEM
Lawrence F Allard, Douglas A Blom , Michael A O'Keefe, Chris J Kiely, D. Ackland, M. Watanabe, M. Kawasaki, T. Kaneyama, H. Sawada
Published online by Cambridge University Press:

01 August 2004, pp. 110-111
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Electron Holography with Cs-corrected TEM
Hannes Lichte, Dorin Geiger, Michael Lehmann, Max Haider, Bert Freitag
Published online by Cambridge University Press:

01 August 2004, pp. 112-113
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Physical Sciences Tutorial: Principles and Practice of Off-Axis Electron Holography

Research Article

Principles and Practice of Off-Axis Electron Holography
Martha R. McCartney
Published online by Cambridge University Press:

01 August 2004, pp. 114-115
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Physical Sciences Tutorial: Practical Scanning Transmission Electron Microscopy

Research Article

Practical Scanning Transmission Electron Microscopy
David A Muller
Published online by Cambridge University Press:

01 August 2004, pp. 116-117
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Micro X-ray Techniques: New Compositional and Structural Characterization Tools

Research Article

Multivariate Statistical Analysis of Wavelength and Energy-Dispersive X-ray Spectral Images
Paul G. Kotula, Michael R. Keenan, Richard P. Grant, Paul F. Hlava
Published online by Cambridge University Press:

01 August 2004, pp. 118-119
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Scanning Soft X-ray Microscopy and Diffraction Imaging
Janos Kirz, Tobias Beetz, Michael Feser, Holger Fleckenstein, Benjamin Hornberger, Malcolm Howells, Chris Jacobsen, Bjorg Larson, Mirna Lerotic, Enju Lima, Ming Lu, Huijie Miao, David Sayre, David Shapiro, Aaron Stein
Published online by Cambridge University Press:

01 August 2004, pp. 120-121
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

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Volume 10 - August 2004

Order in Disorder: Probing the Structure of Amorphous Materials

Research Article

Physical Sciences Tutorial: Electron Diffaction for Modern materials Characterization

Research Article

Electron Energy-Loss and X-ray Absorption Spectroscopies: Focus on Anisotropic Properties

Research Article

Quantitative X-ray Microanalysis

Research Article

Accessorizing the SEM

Research Article

Aberration Correction, Electron Holography, High-Resolution TEM

Research Article

Physical Sciences Tutorial: Principles and Practice of Off-Axis Electron Holography

Research Article

Physical Sciences Tutorial: Practical Scanning Transmission Electron Microscopy

Research Article

Micro X-ray Techniques: New Compositional and Structural Characterization Tools

Research Article