Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
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Numerical Calculation of Secondary Fluorescence Effects Near Phase Boundaries in EPMA
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- Published online by Cambridge University Press:
- 03 August 2008, pp. 126-127
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- Cited by 1
MIPAR™: 2D and 3D Microstructural Characterization Software Designed for Materials Scientists, by Materials Scientists
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- Published online by Cambridge University Press:
- 23 September 2015, pp. 455-456
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Expression of Cyclic AMP-Receptor (cARP) Proteins by Fibroblasts in Culture: Effects of Mechanical Disruption
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- Published online by Cambridge University Press:
- 18 July 2003, pp. 1386-1387
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Quantification of Thin Specimens in a Scanning Transmission Electron Microscope at Low Accelerating Voltage using the f-ratio Method
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 236-237
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An Atom Probe Tomography Investigation of Grain Boundary Segregation in Heat Treated Nanocrystalline Ni-W Alloys
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- Published online by Cambridge University Press:
- 05 August 2007, pp. 1644-1645
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In Situ HREM of Crystallization Reactions
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 416-417
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Quantitative Compositional Stage Mapping and Cluster Analysis Applied to a Vanadian Slag Sample
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- Published online by Cambridge University Press:
- 05 August 2019, pp. 2308-2309
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Assessment of Residual Plastic Strain Using Enhanced Crystallographic Contrast
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- 31 July 2006, pp. 1308-1309
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The Power of Electron Diffraction Phase Analysis and Pattern Simulations Using the ICDD®Powder Diffraction File™ (PDF-4+)
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- Published online by Cambridge University Press:
- 25 July 2016, pp. 1440-1441
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Analytical Transmission Scanning Electron Microscopy: Extending the Capabilities of a Conventional SEM Using an Off-the-Shelf Transmission Detector*
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- Published online by Cambridge University Press:
- 23 September 2015, pp. 1867-1868
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Towards Quantification of the Reaction Product in Oxygen-Evolving Oxides by Operando Electron Energy-Loss Spectroscopy in Liquids
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- 22 July 2022, pp. 812-813
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Near-Simultaneous Core- and Low-Loss EELS Spectrum-Imaging in the STEM using a Fast Beam Switch.
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- Published online by Cambridge University Press:
- 31 July 2006, pp. 1362-1363
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Structural Analysis of Au-Pd Core-Shell Nanoparticles
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- 05 August 2007, pp. 568-569
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The Southwestern Center for Aberration Corrected Electron Microscopy at Arizona State University: The Facility
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- 23 November 2012, pp. 408-409
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Analysis of Contamination in Nanoscaled Film Structures with TEM & XPS
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- 31 July 2006, pp. 734-735
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Optimized Live Volumetric Imaging with Light Sheet Microscopy and Related Strategies
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- 04 August 2017, pp. 2320-2321
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Experience with the IBM Sub-Angstrom STEM
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- Published online by Cambridge University Press:
- 15 July 2003, pp. 136-137
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Orientation Mapping by Precession Transmission Electron Microscopy
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- 23 September 2015, pp. 1661-1662
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Imaging of Fuel Cell and Battery Electrodes Using Focused Ion Beam Scanning Electron Microscopy
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- 25 July 2016, pp. 1310-1311
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Determination of Thin Film Thickness and Composition using Energy Dispersive EPMA
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- Published online by Cambridge University Press:
- 22 July 2022, pp. 672-673
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