Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 21
In Situ High-Resolution Transmission Electron Microscopy (TEM) Observation of Sn Nanoparticles on SnO2 Nanotubes Under Lithiation
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- Published online by Cambridge University Press:
- 08 December 2017, pp. 1107-1115
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- Cited by 21
X-Ray Excited Optical Luminescence and Portable Electron Probe Microanalyzer–Cathodoluminescence (EPMA–CL) Analyzers for On-Line and On-Site Analysis of Nonmetallic Inclusions in Steel
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- Published online by Cambridge University Press:
- 27 November 2017, pp. 1143-1149
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- Cited by 21
Gallium-Induced Milling of Silicon: A Computational Investigation of Focused Ion Beams
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- 04 July 2008, pp. 315-320
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- Cited by 21
Characterization of Cold Spray Titanium Deposits by X-Ray Microscopy and Microtomography
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- 16 May 2008, pp. 260-266
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- Cited by 21
Removing Stripes, Scratches, and Curtaining with Nonrecoverable Compressed Sensing
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- 14 March 2019, pp. 705-710
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- Cited by 21
Quantification and Morphology Studies of Nanoporous Alumina Membranes: A New Algorithm for Digital Image Processing
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- 24 May 2013, pp. 1061-1072
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- Cited by 21
Performance of Dynamically Simulated Reference Patterns for Cross-Correlation Electron Backscatter Diffraction
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- 10 August 2016, pp. 789-802
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- Cited by 21
Bismuth Nanowires for Potential Applications in Nanoscale Electronics Technology
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- 28 March 2002, pp. 58-63
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- Cited by 21
Sleep Deprivation Impairs Ca2+ Expression in the Hippocampus: Ionic Imaging Analysis for Cognitive Deficiency with TOF-SIMS
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- 12 April 2012, pp. 425-435
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- Cited by 21
Augmenting the 3D Characterization Capability of the Dual Beam FIB-SEM
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- 01 August 2004, pp. 1136-1137
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- Cited by 21
Data-Constrained Microstructure Characterization with Multispectrum X-Ray Micro-CT
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- 03 May 2012, pp. 524-530
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- Cited by 21
Identification of Organic Binders in Ancient Chinese Paintings by Immunological Techniques
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- 02 October 2015, pp. 1278-1287
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- Cited by 21
Automated Reconstruction of a Serial-Section EM Drosophila Brain with Flood-Filling Networks and Local Realignment
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- 05 August 2019, pp. 1364-1365
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- Cited by 20
Immuno-Electron Microscopy of Primary Cell Cultures from Genetically Modified Animals in Liquid by Atmospheric Scanning Electron Microscopy
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- 25 February 2014, pp. 469-483
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- Cited by 20
Nanoscale Stoichiometric Analysis of a High-Temperature Superconductor by Atom Probe Tomography
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- 31 January 2017, pp. 414-424
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- Cited by 20
Adsorption Kinetics of DPPG Liposome Layers: A Quantitative Analysis of Surface Roughness
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- 07 June 2013, pp. 867-875
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- Cited by 20
Prospects for Vibrational-Mode EELS with High Spatial Resolution
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- 19 February 2014, pp. 658-663
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- Cited by 20
A Small Spot, Inert Gas, Ion Milling Process as a Complementary Technique to Focused Ion Beam Specimen Preparation
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- 19 June 2017, pp. 782-793
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- Cited by 20
Measurement of Trace Constituents by Electron-Excited X-Ray Microanalysis with Energy-Dispersive Spectrometry
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- 06 May 2016, pp. 520-535
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- Cited by 20
Chameleon: Next Generation Sample Preparation for CryoEM based on Spotiton
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- 05 August 2019, pp. 994-995
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