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This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 36
The 4D Camera: Very High Speed Electron Counting for 4D-STEM
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- Published online by Cambridge University Press:
- 05 August 2019, pp. 1930-1931
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- Cited by 36
Development of an Integrated Thermocouple for the Accurate Sample Temperature Measurement During High Temperature Environmental Scanning Electron Microscopy (HT-ESEM) Experiments
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- Published online by Cambridge University Press:
- 01 April 2015, pp. 307-312
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- Cited by 36
Description of Ore Particles from X-Ray Microtomography (XMT) Images, Supported by Scanning Electron Microscope (SEM)-Based Image Analysis
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- 10 October 2018, pp. 461-470
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- Cited by 36
Single-Molecule Localization Super-Resolution Microscopy: Deeper and Faster
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- 31 October 2012, pp. 1419-1429
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- Cited by 35
Measurement of Cation Exchange Capacity (CEC) of Plant Cell Walls by X-Ray Microanalysis (EDX) in the Transmission Electron Microscope
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- 16 July 2007, pp. 233-244
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- Cited by 35
In Situ Electron Microscopy Studies of the Sintering of Palladium Nanoparticles on Alumina during Catalyst Regeneration Processes
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- 22 January 2004, pp. 77-85
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- Cited by 35
SpRET: Highly Sensitive and Reliable Spectral Measurement of Absolute FRET Efficiency
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- 21 February 2011, pp. 176-190
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- Cited by 35
A Compact “Water Window” Microscope with 60 nm Spatial Resolution for Applications in Biology and Nanotechnology
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- 16 September 2015, pp. 1214-1223
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- Cited by 35
Confocal/TEM Overlay Microscopy: A Simple Method for Correlating Confocal and Electron Microscopy of Cells Expressing GFP/YFP Fusion Proteins
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- 04 July 2008, pp. 342-348
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- Cited by 35
Atom Probe Tomography Interlaboratory Study on Clustering Analysis in Experimental Data Using the Maximum Separation Distance Approach
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- 04 February 2019, pp. 356-366
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- Cited by 35
In Situ Cryogenic Transmission Electron Microscopy for Characterizing the Evolution of Solidifying Water Ice in Colloidal Systems
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- 19 February 2014, pp. 330-337
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- Cited by 35
Accurate Nanoscale Crystallography in Real-Space Using Scanning Transmission Electron Microscopy
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- 14 July 2015, pp. 946-952
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- Cited by 35
Interrelations between the Parasitophorous Vacuole of Toxoplasma gondii and Host Cell Organelles
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- 08 March 2005, pp. 166-174
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- Cited by 35
The Al-Si Phase Diagram
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- 26 July 2009, pp. 60-61
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- Cited by 35
Improving the Accuracy of Orientation Measurements using EBSD
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- 09 October 2013, pp. 724-725
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- Cited by 34
Quantitative Analysis of ZO-1 Colocalization with Cx43 Gap Junction Plaques in Cultures of Rat Neonatal Cardiomyocytes
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- 12 May 2005, pp. 244-248
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- Cited by 34
Measurement of Polystyrene Mean Inner Potential by Transmission Electron Holography of Latex Spheres
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- 28 July 2005, pp. 146-157
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- Cited by 34
Compressed Sensing of Scanning Transmission Electron Microscopy (STEM) With Nonrectangular Scans
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- 27 December 2018, pp. 623-633
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- Cited by 34
In Situ Studies of the Interaction of Dislocations with Point Defects during Annealing of Ion Implanted Si/SiGe/Si (001) Heterostructures
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- 28 July 2005, pp. 294-307
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- Cited by 34
Standardless Quantitative Electron-Excited X-ray Microanalysis by Energy-Dispersive Spectrometry: What Is Its Proper Role?
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- 28 July 2005, pp. 585-597
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