Microscopy and Microanalysis: Volume 28 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Physical Sciences Symposia

Advanced Imaging and Spectroscopy for Nanoscale Materials

Study of Graphene and Thin Foils by a Time-of-Flight Spectrometer for Low Landing Energies

Surface Morphology of Nanostructured TiO2@Graphene Composites Obtained by Lyophilization

TEM Analysis and Mechanical Properties of Ternary Mn+1AXn and Binary MXene for Applications in Nanocoating Technology

Topotactic Phase Transformation of Single Crystalline Tetragonal SnO to Orthorhombic SnO2

Uranium reduction by magnetite – mechanism of UO2 formation monitored by STEM, SAED and EELS

Use of Partial Scattering EDX Cross-Sections to Quantify Light Elements in the STEM

Detecting Exotic Vibrational States at Interfaces by Electron Microscopy

Spectroscopy of Nanosphere-Substrate Coupling: The Role of Multipolar Surface Phonon Modes

Understanding the Surface Chemistry Dependent Plasmon Response in Ti3C2Tx MXenes using Monochromated STEM-EELS

Strain Relaxation and Excitonic Absorption of Atomically-Reconstructed WSe2 Moiré Superlattices

Nanoscale Vibrational Spectroscopy to Probe Li Motion at Individual Interfaces in Battery Materials

Characterization of Embedded Secondary Phase Carbides in Low-Alloyed Martensitic Steels Using a Combination of High-Resolution Techniques

Exsolution of Core-Shell Nanoparticles in a Complex Concentrated Perovskite Oxide Thin Film Synthesized in One Step

Deactivation study on zeolite materials using XPS and STEM characterization

Development of a Stable Low Temperature Sample Holder for the Side-Entry Transmission Electron Microscope

Dispersion Analysis of Silicon Carbide Nanoparticles in Polyvinyl Alcohol Polymeric Matrix by Electronic Microscopy Techniques

Epitaxy of the Metal and Oxide Phases in Pt-Pd ‘Janus’ Particles in 800 °C Air-aged Diesel Oxidation Catalysts

Fast Solid-state Segmented Detectors: Improvements and Implications for DPC-STEM

Imaging of Defect Rich Heterogeneous Interfaces using Compressive Sensing STEM

Insights into Thermal Degradation of Hot Melt Pressure-Sensitive Adhesive (PSA) with Atomic Force Microscopy - Infrared Spectroscopy (AFM-IR) Analysis

Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Physical Sciences Symposia

Advanced Imaging and Spectroscopy for Nanoscale Materials