Microscopy and Microanalysis: Volume 28 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Physical Sciences Symposia

Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions

Overcoming Artifacts in Imaging Nanometer-thick Ionomer Layers in Anion Exchange Membrane Fuel Cells

Advances in Beam-sensitive Sample Preparation and Observation

Latency Dose Formation In DMC By Inelastic Electron Scattering

How Low Can You Go: Pushing the Limits of Dose and Frame-time in the STEM

Machine-Learning Assisted Exit-wave Reconstruction for Quantitative Feature Extraction

Electron Counted STEM-EELS Spectroscopy Optimized for low kV (< 80 kV) via Hybrid Pixel Detection

Electrostatic Switching for Spatiotemporal Dose Control in a Transmission Electron Microscope

On Demand - Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-Beam Sample Interactions

3D Atom Dynamics in Pt-NiO Nanocrystals

A Readily-automated Scheme for Estimating the Critical Dose of Beam-Sensitive Materials

Crystalline Arrangement of Organic Molecules in Ammonium Urates as Determined by Electron Microscopy

Enhancing Electron Computational Ghost Imaging Using Artificial Neural Networks

High-Resolution Electron Diffraction of Protein Crystals in Their Liquid Environment at Room Temperature Using a Direct Electron Detection Camera

Structural Biology in the Liquid State: Shedding Light on Protein Dynamics

The Electron Microscopy of Heterostructures Made of Perovskite Phases in Light Emitting Crystals.

Using 4D-STEM to Track Structural Changes Due to Electrochemical Doping in Organic Electrochemical Transistors

Low-dose HRTEM Study of Stacking Fault Structures in Cubic Ice

SEM Image Analysis on the Formation of Porous Anodic Alumina Templates

Insights into Phase Transitions in Functional Materials by In Situ/Operando TEM: Experiment Meets Theory

In situ TEM Study of Ferroelectric Oxide Heterostructures

Operando Observation of Reversible Oxygen Migration and Phase Transitions in Hafnia-based Ferroelectric Devices

Determining the Polarization Fraction of Thin Film Ferroelectric HZO with STEM EBIC

Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Physical Sciences Symposia

Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions

On Demand - Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-Beam Sample Interactions

Insights into Phase Transitions in Functional Materials by In Situ/Operando TEM: Experiment Meets Theory