Microscopy and Microanalysis: Volume 28 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Physical Sciences Symposia

Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments

3D Nanoscale Analysis of Implanted Deuterium in Tungsten using Atom Probe Tomography

Advanced Characterization of Fuel Cladding Chemical Interaction between U-10Zr Fuel and HT9 Cladding Tested in Fast Flux Test Facility

Quantifying Defect Pathways for Disorder in La1-xSrxFeO3 / SrTiO3 Thin Films

Bridging the Atomic Scale and the Mesoscale in the Characterization of Defect Production and Evolution in High Entropy Alloys

Revisit the Effect of He+ Irradiation on the Structure and Mechanics of Metallic Glass

In situ 4D-STEM Imaging to Develop a Fundamental Understanding of Coupled Transport of Vacancies

Real-Time and Correlative Imaging of Localised Corrosion Events by High-Speed Atomic Force Microscopy

Integration of Gas-Cell TEM, Nano-calorimetry and RGA on Oscillating Phenomena at High Temperatures in Catalysis

Correlative Multimodal Microscopy Using AFM-in-SEM in Material Science

Correlative Microscopy Reveals Air-Stable 2D Gallium-Intercalated Monolayer Epitaxial Graphene

On Demand - Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments

A Novel Pathway for Multi-scale High-resolution Time-resolved Residual Stress Evaluation of Laser-welded Eurofer97

Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions

Probing Atom Dynamics in Excited Nanocrystals

Optimizing STEM Imaging Conditions Towards Reliable Representation of Single Atom Catalysts

Low Dose Methods for Atomic-scale Transmission Electron Microscopy of Cs1-xFAxPbI3 Quantum Dots: Structure, Defects, and Performance

Sparsity and Noise Effects on the Reconstruction of Subsampled Scanning Transmission Electron Microscopy Data

Spatial Distribution of the Electron Dose and the Effects on Beam Damage in STEM

AXON Dose: A Machine Vision Solution for Accurate, Quantifiable Dose Management in the Transmission Electron Microscope

Development of an Organic Controlled Environment Vitrification System to Expand Cryo-Protection of Beam Sensitive Materials

Electron Microscopy Characterization of Gold Nanoparticles Supported on an Ordered TiO2 Nanowires Array.

Exploring Electron Energy-Loss Spectroscopy for Characterization of Structured Fluids

Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Physical Sciences Symposia

Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments

On Demand - Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments

Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions