Microscopy and Microanalysis: Volume 28 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Analytical Sciences Symposia

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens

Recent Innovations and Perspectives in TOF-SIMS

SIMS Imaging Performed on Focused Ion Beam - based Platforms

Expanded Materials Sample Platforms for Advanced Surface Analysis of Energy Materials

Application of Electron Back Scattering Diffraction in Facet Crystalline Orientation Analysis

Quick and Correlative TOF-SIMS Analysis of Dispersoid Content in Powder Feedstock and Printed Oxide Dispersion Strengthened Alloys

New Horizons in Multi-Technique Auger Electron Spectroscopy: Nanoscale Surface Sensitive Chemical Imaging of Additive Manufacturing Materials

Multi-Modal Identification of Feldspar and Iron Oxide Phases in Granite Using Raman Spectroscopy in the Electron Microscope

Mapping Surface Corrosion Damages of C1018 Carbon Steel When Exposed to High Temperature Environment

Ambient Mass Spectrometry Imaging of Lipid Molecules from Live Cells and Tissues Using Nanomaterials

Development and Validation of In-Situ Specimen Orientation Method for Quantitative SEM/EDS Analysis

Correlated Materials Characterization via Multimodal Chemical Imaging and Data Analytics

SIMS Uranium Isotope Analysis of NIST Standard Glasses to Determine Detection Limits

Quantitative Piezoresponse Force Microscopy Informed by Cantilever Vibrations

XPS Surface analysis augmented using correlative spectroscopy and microscopy

Structural Analysis of Liquid-Exfoliated Graphene as Building-Blocks for Anti-Corrosion thin films

On Demand - Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens

Energy Dispersive X-ray Spectrum Simulation with NIST DTSA-II: Comparing Simulated and Measured Electron-Excited Spectra

Influence of Sterilization on the Surface of Nanoparticles Studied with XPS / HAXPES in Comparison to SEM / EDS

Latest applications of ToF-SIMS characterization for next-generation electronic materials

Mass Spectrometry Imaging of Organic Biomarkers in Geological Samples

Multimodal Imaging of the Evolving Interface of Irradiated Aluminide-coated Stainless-steel Cladding

Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Analytical Sciences Symposia

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens

On Demand - Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens