Microscopy and Microanalysis: Volume 28 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Analytical Sciences Symposia

From Operando Microcell Experiments to Bulk Devices

Stability of Fe Electrode in Alkaline Electrolyte

Battery in situ Electrical Testing in FIB-SEM

Structure and Field Evolution of Magnetic Skyrmions in Co/Pt-Based Multilayers by In-Situ Electron Holography

In-situ TEM and Spectroscopy Studies of Nanoscale Perpendicular Magnetic Tunnel Junction

In-situ Study of Skyrmions at High Resolution using Differential Phase Contrast Microscopy

In-situ Transmission Electron Microscopy Study of the Impact of External Electric Field in 2D Perovskites

Development of Operando X-ray Ptychography at the Advanced Light Source

On Demand - From Operando Microcell Experiments To Bulk Devices

Degradation of Al Current Collector in Lithium-Ion Batteries Using Liquid Phase Electron Microscopy

High Angle Liquid Cell TEM Tomography for In Situ Observation and 3D Reconstruction in Liquid

Ultrashort Pulse Lasers: Microscopy, Simulations, and Material Interactions

Atomistic Modeling of Ultrashort Pulse Laser-Induced Generation of Crystal Defects

Merging Machine Learning and TriBeam Tomography for 3D Defect Detection in an AM CoNi-Based Superalloy

Femtosecond Laser Heat Affected Zones in Aluminum

A Multiscale, Correlative, Air Free Workflow for the Analysis of Li Distribution in Batteries via ToF-SIMS

Application of a Correlative fs-Laser Workflow for Fast and Easy Feature Access in Failure Analysis of Recycled Automotive Body Parts

Observations of Damage, Defects, and Structuring in Femtosecond Laser Ablated Surfaces

Preparing High-Quality Cross-Section Surfaces by Ultrashort Pulse Laser Ablation and Plasma FIB

Single Image Composite Tomography Utilizing Large Scale Femtosecond Laser Cross-sectioning and Scanning Electron Microscopy

Probing Material Dynamics with an SEM at Nanometer Length and Picosecond Time-scales

The Preparation of Large Area Transmission Kikuchi Diffraction Samples From Bulk Material Without Requiring Lift Out

Opportunities and Challenges of Ultra Short Pulsed Lasers with Dual Focused Ion Beams for Characterization of Full-Scale Electronic Devices

Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Analytical Sciences Symposia

From Operando Microcell Experiments to Bulk Devices

On Demand - From Operando Microcell Experiments To Bulk Devices

Ultrashort Pulse Lasers: Microscopy, Simulations, and Material Interactions