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Microscopy and Microanalysis
Volume 11 Issue s02

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Microscopy and Microanalysis

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Nanostructured materials (54)

Quantitative Characterization, Simulation, and Representation of Microstructures (40)

Advances in High-Resolution Electron Microscopy: A Symposium Dedicated to the Memory of John Maxwell Cowley (38)

Breakthrough Microscopy in Catalysis, Nanoparticles and Energy (33)

High-Resolution STEM Analysis of Functional NanoMaterials (33)

Cell Pathology (32)

FIB/Dual Platform Applications and Techniques in Biological and Physical Sciences (32)

Materials Research in an Aberration-Free Environment (30)

Scanning Electron Microscopy and X-ray Microanalysis the Next 35 Years: A Symposium Celebrating Joe Goldstein's 65th Birthday (30)

Tomography in Biological and Materials Sciences (28)

Microbiology, Pathogenesis and Pathology (24)

Quantitative X-ray Microanalysis (24)

Variable Pressure Electron Microscopy: Advances in the Nanotechnology and Biomaterials Age (24)

Cryo-EM of Molecular Assemblies (22)

Advances in In-situ Electron Microsocpy Technique and Applications (21)

Failure Analysis and Prevention (21)

Botany (20)

From the Static to the Dynamic: Correlative and High Resolution Biological Imaging and Labeling (20)

Presidential Symposium: The Golden Anniversary of Imaging Atoms (20)

Scanned Probe Microscopy and Nanoanalysis: Probing Properties at the Nanoscale (20)

Manipulation of Microstructure to Improve Properties and Performance (19)

Metals and Alloys (19)

Magnetic and Superconducting Materials (18)

Advances in Energy-Filtered Transmission Electron Microscopy (17)

Biological Specimen Preparation (17)

Characterizing the Limits of EBSD Analysis (16)

Microanalysis of Extraterrestrial Materials: New Techniques and Applications (16)

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Industry (16)

Scanning Electron Microscopy (SEM) (16)

Semiconductors (16)

Advanced Detectors (15)

Advances in Microstructurial Characterization Techniques (15)

Recent Progress in 3D Microscopy Imaging (14)

Spectral Imaging: Advances and Applications (14)

Advances in Instrumentation and Technique (13)

Advances in Ultrastructural Studies at Low Temperatures for Cryo TEM and SEM (13)

Interfaces (13)

Radiation Effects in Materials (13)

Reproduction and Development (13)

Structural Biology (13)

Biomaterials and Tissue Engineering (12)

Nano Scale Engineering & Self Assembly (12)

Vascular Corrosion Casting (12)

Modes of Cell-Cell and Cell-ECM Communication (11)

Digital Imaging (10)

Phase Transformations (10)

Green Fluorescent Protein and its Relatives (9)

Metallographic Techniques and Applications (9)

Advances in Fluorescence, Flow Cytometry and Cytomics (8)

Confocal Microscopy (8)

Microscopy and Imaging in the Digital Age (8)

Oxidation (8)

STEM Cells (8)

Films / Coatings (7)

Geology (7)

Ultrafast Electron Diffraction and Microscopy (7)

Composites (6)

Particle Analysis (6)

Specimen Preparation for Materials Sciences (6)

Technologists’ Forum: Low Temperature Technologies for Electron Microscopy (6)

Fluorescence (Förster) Resonance Energy Transfer (FRET) Microscopy (5)

Ceramics (4)

Core Facility Management (4)

Crystallography (4)

Polymers (4)

Ferroelectrics (3)

Corporate Session (2)

Industrial Real World Microscopy (2)

Building Order in Large Image Data Sets: Classification Techniques at Work! (1)

Computational Tools for Interpreting Electron Tomograms (1)

Confocal Microscopy System Performance: Spectroscopy and Foundations for Quantitation (1)

Improved Electron Microscopy with Monte Carlo Simulations (1)

In-situ Electron Microscopy: A Practical Tutorial (1)

Quantum Dots as Cellular Probes for Light and Electron Microscopy (1)

Theory and Applications of Focal-Series Reconstruction in HRTEM (1)

What is Fluctuation Electron Microscopy? (1)

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Microscopy and Microanalysis
ISSN: 1431-9276

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Volume 11 - Issue S02 - August 2005

Contents

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Geology

Research Article

Observation of the Structure of Iridescent Surface Layer on Chalcopyrite
K Z Baba-Kishi, M K Lee, C W Tai
Published online by Cambridge University Press:

01 August 2005, pp. 1770-1771
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

SEM Evidence of Acidithiobacillus Ferrooxidans (Af) Attachment to Sulfide Refractory Ore Surface
P de Lira, L Córdoba, E Orrantia, S G Flores, M A Makita
Published online by Cambridge University Press:

01 August 2005, pp. 1772-1773
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Characterization of Epitaxial Bands and Electron Beam Damage in Natural Zircon Using Cathodoluminescence.
J L Mey, A Klaus
Published online by Cambridge University Press:

01 August 2005, pp. 1774-1775
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

A Microscopy Study on the Origin of Asterism in Almandine-Pyrope Garnets
M J F Guinel, M G Norton, D F Bahr
Published online by Cambridge University Press:

01 August 2005, pp. 1776-1777
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

3D Reconstruction of Natural Soil Aggregates from the Tropics
G A Vrdoljak, R Zalpuri
Published online by Cambridge University Press:

01 August 2005, pp. 1778-1779
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Interfaces

Research Article

EBSD Analysis of Solid-State Reactions Between Al2O3 and Cu2O
J K Farrer, M M Nowell
Published online by Cambridge University Press:

01 August 2005, pp. 1780-1781
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Microstructural Studies of a Directionally Solidified Nb-27Mo-27Cr-9Al-9Si Alloy
Y L Hu, A L Vasiliev, L C Zhang, M Aindow, D M Shah
Published online by Cambridge University Press:

01 August 2005, pp. 1782-1783
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Determination of Strain Relaxation at the Free Surfce of Strained-SiGe Film Using Convergent Beam Electron Diffraction
S-I Baik, Y-W Kim
Published online by Cambridge University Press:

01 August 2005, pp. 1784-1785
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Microstructures of a Highly Conductive Nb:SrTiO3 Thin Film
Y L Zhu, X L Ma
Published online by Cambridge University Press:

01 August 2005, pp. 1786-1787
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

ADF-STEM Imaging of c-Si/a-Si Interfaces
Y Yan, Q Wang, M Page, T Wang, M M Al-Jassim
Published online by Cambridge University Press:

01 August 2005, pp. 1788-1789
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Kinetics of Agglomeration of Gibbsite Al(OH)3 Crystals in the Precipitation Stage of the Bayer Process
E Farias, D Del Ollo, J Gomez, B Hidalgo
Published online by Cambridge University Press:

01 August 2005, pp. 1790-1791
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Control of Grain Boundaries in Orthorhombic Alpha-Uranium
D A Carpenter, J L Pugh, D F Teter
Published online by Cambridge University Press:

01 August 2005, pp. 1792-1793
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Flattening of the Si-SiO2 Interface in Ultra-Thin SIMOX Structures
T Jutarosaga, S Seraphin
Published online by Cambridge University Press:

01 August 2005, pp. 1794-1795
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Shifting Through Phase Fields: CaAl4O7 on Sapphire
A Altay, M A Gulgun, C B Carter
Published online by Cambridge University Press:

01 August 2005, pp. 1796-1797
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

An Interfacial Study of Borosilicate Glass and Fe-Ni-Co Alloy Joint
C Chanmuang, T Chairuangsri
Published online by Cambridge University Press:

01 August 2005, pp. 1798-1799
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Imaging and Characterization of the Microstructure and Creep Deformation Mechanisms of Commercial Nickel-based Superalloys
P M Sarosi, G B Viswanathan, W Demania, R Unocic, M J Mills
Published online by Cambridge University Press:

01 August 2005, pp. 1800-1801
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Magnetic and Superconducting Materials

Research Article

In-situ Lorentz TEM Observations in Ferromagnetic Shape Memory Alloys
S P Venkateswaran, N T Nuhfer, M De Graef
Published online by Cambridge University Press:

01 August 2005, pp. 1802-1803
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Transmission Electron Microscopy Study of FeHfN Thin Films for Magnetic Properties Optimization and Integration Above Silicon Circuits.
R Pantel, S Couderc, P Ancey, C Wyon, B Viala
Published online by Cambridge University Press:

01 August 2005, pp. 1804-1805
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

High-Resolution Analytical TEM and Energy-Filtered Imaging of CoPt-Oxide Perpendicular Magnetic Recording Media
J D Risner, T P Nolan, J Bentley, S Z Wu, S D Harkness IV, R Sinclair
Published online by Cambridge University Press:

01 August 2005, pp. 1806-1807
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Lorentz TEM Characterization of Al-Cu-Ge-Mn Alloys
J P Winer, N T Nuhfer, M E McHenry, M De Graef
Published online by Cambridge University Press:

01 August 2005, pp. 1808-1809
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

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