Ultrafast Electron Diffraction and Microscopy
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Prospects for Ultrafast Electron Microscopy: Electron Pulse Compression and Spatial Coherence
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- 01 August 2005, pp. 42-43
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Phase Transformation Analysis in Titanium at Nanosecond Time-Resolution
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- 01 August 2005, pp. 44-45
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Advances in Energy-Filtered Transmission Electron Microscopy
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EFTEM Analysis of FIB Sections: An Important Tool in Nanotechnology
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- 01 August 2005, pp. 46-47
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New Developments in Energy-filtering Transmission Electron Microscopy
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- 01 August 2005, pp. 48-49
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3D Elemental Distributions in Biological Structures by EFTEM Tomography
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- 01 August 2005, pp. 50-51
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Characterizing the Limits of EBSD Analysis
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Improving the Spatial Resolution of EBSD
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- 01 August 2005, pp. 52-53
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Defining Electron Backscatter Diffraction Resolution
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- 01 August 2005, pp. 54-55
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Advances in High-Resolution Electron Microscopy: A Symposium Dedicated to the Memory of John Maxwell Cowley
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High Resolution Electron Microscopy of Carbonaceous Materials
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- 01 August 2005, pp. 56-57
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Strategies for Aberration Control in Sub-Angstrom HRTEM
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- 01 August 2005, pp. 58-59
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Digital Imaging
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Single Particle Reconstructions at Subnanometer Resolution from a JEOL 2010F and a 4k x 4k Gatan CCD Camera
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- 01 August 2005, pp. 60-61
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Analysis of the Performance of an 8k x 8k Lens Coupled Detector for Wide-field, High-resolution Transmission Electron Microscopy (TEM)
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- 01 August 2005, pp. 62-63
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Recent Progress in 3D Microscopy Imaging
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Imaging of Chemical Processes via Electrical, Optical, and Ultrasonic Tomography
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- 01 August 2005, pp. 64-65
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Biologically Accurate Modeling of Mouse Brain Requires Biologically Accurate Networks
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- 01 August 2005, pp. 66-67
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Microscopy and Imaging in the Digital Age
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Public-opened Internet Electron Microscopy 2005 in Japan ---- Remote-control SEM and TEM for High-school Users ----
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- 01 August 2005, pp. 68-69
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Organizing an Image Database on the Web for Teaching and Research
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- 01 August 2005, pp. 70-71
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Advances in Microstructurial Characterization Techniques
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The Three-Dimensional Microstructure of Materials: Measurement and Analysis
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- 01 August 2005, pp. 72-73
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Analytical Instrumentation for Nano-Analysis
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- 01 August 2005, pp. 74-75
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Metallographic Techniques and Applications
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Marshall's Reagent: Origins, Modifications, and New Applications
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- 01 August 2005, pp. 76-77
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Sigma Phase Characterization in AISI 316 Stainless Steel
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- 01 August 2005, pp. 78-79
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Confocal Microscopy
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Multifocal Three-Dimensional Imaging with Optical Lattice Excitation
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- 01 August 2005, pp. 80-81
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