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Microscopy and Microanalysis
Volume 11 Issue s02

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Microscopy and Microanalysis

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Nanostructured materials (54)

Quantitative Characterization, Simulation, and Representation of Microstructures (40)

Advances in High-Resolution Electron Microscopy: A Symposium Dedicated to the Memory of John Maxwell Cowley (38)

Breakthrough Microscopy in Catalysis, Nanoparticles and Energy (33)

High-Resolution STEM Analysis of Functional NanoMaterials (33)

Cell Pathology (32)

FIB/Dual Platform Applications and Techniques in Biological and Physical Sciences (32)

Materials Research in an Aberration-Free Environment (30)

Scanning Electron Microscopy and X-ray Microanalysis the Next 35 Years: A Symposium Celebrating Joe Goldstein's 65th Birthday (30)

Tomography in Biological and Materials Sciences (28)

Microbiology, Pathogenesis and Pathology (24)

Quantitative X-ray Microanalysis (24)

Variable Pressure Electron Microscopy: Advances in the Nanotechnology and Biomaterials Age (24)

Cryo-EM of Molecular Assemblies (22)

Advances in In-situ Electron Microsocpy Technique and Applications (21)

Failure Analysis and Prevention (21)

Botany (20)

From the Static to the Dynamic: Correlative and High Resolution Biological Imaging and Labeling (20)

Presidential Symposium: The Golden Anniversary of Imaging Atoms (20)

Scanned Probe Microscopy and Nanoanalysis: Probing Properties at the Nanoscale (20)

Manipulation of Microstructure to Improve Properties and Performance (19)

Metals and Alloys (19)

Magnetic and Superconducting Materials (18)

Advances in Energy-Filtered Transmission Electron Microscopy (17)

Biological Specimen Preparation (17)

Characterizing the Limits of EBSD Analysis (16)

Microanalysis of Extraterrestrial Materials: New Techniques and Applications (16)

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Industry (16)

Scanning Electron Microscopy (SEM) (16)

Semiconductors (16)

Advanced Detectors (15)

Advances in Microstructurial Characterization Techniques (15)

Recent Progress in 3D Microscopy Imaging (14)

Spectral Imaging: Advances and Applications (14)

Advances in Instrumentation and Technique (13)

Advances in Ultrastructural Studies at Low Temperatures for Cryo TEM and SEM (13)

Interfaces (13)

Radiation Effects in Materials (13)

Reproduction and Development (13)

Structural Biology (13)

Biomaterials and Tissue Engineering (12)

Nano Scale Engineering & Self Assembly (12)

Vascular Corrosion Casting (12)

Modes of Cell-Cell and Cell-ECM Communication (11)

Digital Imaging (10)

Phase Transformations (10)

Green Fluorescent Protein and its Relatives (9)

Metallographic Techniques and Applications (9)

Advances in Fluorescence, Flow Cytometry and Cytomics (8)

Confocal Microscopy (8)

Microscopy and Imaging in the Digital Age (8)

Oxidation (8)

STEM Cells (8)

Films / Coatings (7)

Geology (7)

Ultrafast Electron Diffraction and Microscopy (7)

Composites (6)

Particle Analysis (6)

Specimen Preparation for Materials Sciences (6)

Technologists’ Forum: Low Temperature Technologies for Electron Microscopy (6)

Fluorescence (Förster) Resonance Energy Transfer (FRET) Microscopy (5)

Ceramics (4)

Core Facility Management (4)

Crystallography (4)

Polymers (4)

Ferroelectrics (3)

Corporate Session (2)

Industrial Real World Microscopy (2)

Building Order in Large Image Data Sets: Classification Techniques at Work! (1)

Computational Tools for Interpreting Electron Tomograms (1)

Confocal Microscopy System Performance: Spectroscopy and Foundations for Quantitation (1)

Improved Electron Microscopy with Monte Carlo Simulations (1)

In-situ Electron Microscopy: A Practical Tutorial (1)

Quantum Dots as Cellular Probes for Light and Electron Microscopy (1)

Theory and Applications of Focal-Series Reconstruction in HRTEM (1)

What is Fluctuation Electron Microscopy? (1)

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Microscopy and Microanalysis
ISSN: 1431-9276

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Volume 11 - Issue S02 - August 2005

Contents

Page 18 of 54

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Advances in Microstructurial Characterization Techniques

Research Article

Confocal μ–XRF and μ–XAFS Studies of an Uranium-Rich Sediment from a Nuclear Waste Disposal Natural Analogue Site
M A Denecke, K Janssens, J Rothe, U Noseck, R Simon
Published online by Cambridge University Press:

01 August 2005, pp. 684-685
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

In-situ Electron Microscopy: A Practical Tutorial

Research Article

In-situ Electron Microscopy: A Practical Tutorial
E A Stach
Published online by Cambridge University Press:

01 August 2005, pp. 686-687
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

What is Fluctuation Electron Microscopy?

Research Article

Fluctuation Electron Microscopy for the MASses
M M J Treacy
Published online by Cambridge University Press:

01 August 2005, pp. 688-689
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Metallographic Techniques and Applications

Research Article

Ductile Iron Nodularity Assessment: A Comparison Between Various Manual Procedures and Image Analysis
O D Baron, G Lucas
Published online by Cambridge University Press:

01 August 2005, pp. 690-691
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Two Examples of Award Winning Metallography
F Noecker
Published online by Cambridge University Press:

01 August 2005, pp. 692-693
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Color Etching of Mg-Al Alloys
A Maltais, M Fiset, D Dubé
Published online by Cambridge University Press:

01 August 2005, pp. 694-695
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Microstructure of Powder Metallurgy Components
G Vander Voort, E Manilova
Published online by Cambridge University Press:

01 August 2005, pp. 696-697
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Using Metallography, Scanning Electorn Microscope and Energy Dispersive Spectroscopy Techniques to Enhance Failure Analysis on Aerospace Componets
W Heady
Published online by Cambridge University Press:

01 August 2005, pp. 698-699
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Microstructural Analysis of 5XXX Series Aluminum Alloys for Optimal Strength and Corrosion Resistance
K Unocic, M Mills, G Daehn, P Kobe
Published online by Cambridge University Press:

01 August 2005, pp. 700-701
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Polymer Sample Preparation for Electron Microscopy
A Schrand
Published online by Cambridge University Press:

01 August 2005, pp. 702-703
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Advances in Instrumentation and Technique

Research Article

Design of an Analytical TEM/STEM with 0.3 srad EDX Detection
H S von Harrach, P C Tiemeijer, J Ringnalda
Published online by Cambridge University Press:

01 August 2005, pp. 704-705
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Development and Application of a New 200kV TEM/STEM System with an LaB6 Electron Gun
I Ishikawa, K Yamazaki, E Okunishi, N Endo
Published online by Cambridge University Press:

01 August 2005, pp. 706-707
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

200 kV TEM with a Zernike Phase Plate
S Motoki, F Hosokawa, Y Arai, R Danev, K Nagayama
Published online by Cambridge University Press:

01 August 2005, pp. 708-709
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Detection of Interstitial Atoms by Hollow-Cone Illumination HAADF-STEM
K Saitoh, N Tanaka
Published online by Cambridge University Press:

01 August 2005, pp. 710-711
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

0.60 eV Energy Resolution in EELS Using a Depleted Thermionic LaB6-Cathode
C Mitterbauer, W Grogger, G Kothleitner, R Spehr, P Tiemeijer, F Hofer
Published online by Cambridge University Press:

01 August 2005, pp. 712-713
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Comparison of SCEM and STEM-HAADF Imaging in Thick Specimens
N J Zaluzec, J Hiller
Published online by Cambridge University Press:

01 August 2005, pp. 714-715
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Applications of a Bayesian Based Maximum Entropy Method to Energy Dispersive X-ray Spectra
T Shinkawa, N Nakamura, H Kato, K Shibuya, M Nakata
Published online by Cambridge University Press:

01 August 2005, pp. 716-717
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

HARECES Measurements of Carbon K Shell Excitation in Graphite
N J Zaluzec, M G Blackford, K L Smith, M Colella
Published online by Cambridge University Press:

01 August 2005, pp. 718-719
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Measurement of Crystal Symmetry using HARECXS
N J Zaluzec
Published online by Cambridge University Press:

01 August 2005, pp. 720-721
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Measuring the Characteristic Length Scale of Medium Range Order in Amorphous Silicon Using Variable Resolution Fluctuation Electron Microscopy
L N Nittala, R D Twesten, P M Voyles, J R Abelson
Published online by Cambridge University Press:

01 August 2005, pp. 722-723
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

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