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Volume 11 - Issue S02 - August 2005

Contents

Page 17 of 54

Recent Progress in 3D Microscopy Imaging

Research Article

  • Development of a Real-Time Stereo Transmission Electron Microscope

  • H Tanaka, T Kojima, H Tsuruta, J Chen, T Tanji, M Ichihashi
  • Published online by Cambridge University Press:
    01 August 2005, pp. 644-645
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Microscopy and Imaging in the Digital Age

Research Article

  • Virtual Electron Microscopy for Undergraduate/Graduate Classes

  • E Humphrey
  • Published online by Cambridge University Press:
    01 August 2005, pp. 646-647
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Virtual Microscopy Using High-Resolution Image Datasets

  • G Fried, B Grosser, T Gaskins, A Klementiev
  • Published online by Cambridge University Press:
    01 August 2005, pp. 648-649
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Virtual SEM (VSEM) A Teaching and Training Solution for the SEM

  • G C Martin, B C Breton, N H M Caldwell, D M Holburn
  • Published online by Cambridge University Press:
    01 August 2005, pp. 650-651
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Administrative Issues In Developing An Electron Microscopy Outreach Program

  • B Thompkins
  • Published online by Cambridge University Press:
    01 August 2005, pp. 652-653
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Development of Educational Curricula Based on Digital Microscopes

  • G S Casuccio, S K Kennedy
  • Published online by Cambridge University Press:
    01 August 2005, pp. 654-655
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Education and Industry Partnerships: Development of Advanced Instrumentation Training Program at Columbia Basin College

  • R A Westberg, C C Bunker, E P Grimsrud, R J Lee
  • Published online by Cambridge University Press:
    01 August 2005, pp. 656-657
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Building Order in Large Image Data Sets: Classification Techniques at Work!

Research Article

  • Building Order in Large Image Data Sets: Classification Techniques at Work

  • J M Carazo Garcia
  • Published online by Cambridge University Press:
    01 August 2005, pp. 658-659
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Advances in Microstructurial Characterization Techniques

Research Article

  • Atomic-Scale Quantitative Three-Dimensional Characterization with a Local Electrode Atom Probe

  • T Kelly, R Ulfig, K Thompson, D Larson
  • Published online by Cambridge University Press:
    01 August 2005, pp. 660-661
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Electron Tomography for Nanoscale Materials Science

  • P A Midgley, T Yates, I Arslan, J Tong, J M Thomas
  • Published online by Cambridge University Press:
    01 August 2005, pp. 662-663
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Keratin Intermediate Filament Three-Dimensional Arrangements Modeled from TEM Tomograms of Romney Wool Cortical Cells

  • J P Caldwell, D N Mastronarde, J L Woods, W G Bryson
  • Published online by Cambridge University Press:
    01 August 2005, pp. 664-665
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Microstructural Characterization of Aerospace Materials via Serial Sectioning Using the Dual Beam FIB-SEM

  • M Uchic, M Groeber, R Wheeler IV, R Kerns, F Scheltens, D Dimiduk
  • Published online by Cambridge University Press:
    01 August 2005, pp. 666-667
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • High Temperature Laser Scanning Confocal Microscopy for Real-time Studies of Phase Transformations

  • D Phelan, M H Reid, R Dippenaar
  • Published online by Cambridge University Press:
    01 August 2005, pp. 670-671
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Integrated Electron Backscatter Diffraction and X-Ray Energy Dispersive Spectroscopy in the Scanning Electron Microscope

  • S I Wright, M M Nowell
  • Published online by Cambridge University Press:
    01 August 2005, pp. 672-673
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Nondestructive, High-Resolution Materials Characterization with the CR-AFM

  • U Schmidt, A Jauss, W Ibach, K Weishaupt, O Hollricher
  • Published online by Cambridge University Press:
    01 August 2005, pp. 674-675
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • XPS for Quantitative Analysis of Surface Nano-structures

  • S Tougaard
  • Published online by Cambridge University Press:
    01 August 2005, pp. 676-677
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Synchrotron Based X-ray Microscopy and Micro-Spectroscopy: Multidisciplinary Tools

  • J Susini
  • Published online by Cambridge University Press:
    01 August 2005, pp. 678-679
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Development of a Hard X–ray Nanoprobe Beamline at the Advanced Photon Source

  • J Maser, B Stephenson, R Winarski, C Benson, D Shu, B Lai, S Vogt, M Holt
  • Published online by Cambridge University Press:
    01 August 2005, pp. 680-681
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Confocal X-ray Fluorescence Imaging and XRF Tomography for Three-Dimensional Trace Element Microanalysis

  • L Vincze
  • Published online by Cambridge University Press:
    01 August 2005, pp. 682-683
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 17 of 54