Instrumentation and Techniques
Effects of Metallographic and Other Preparation Techniques on Microstructural Characterization
Abstract
Effects of Sample Preparation on Electron Probe Microanalysis of Alpha-Plutonium
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- 08 April 2017, pp. 1042-1043
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Electron Probe Microanalysis of Uranium Localization in Alpha-Plutonium
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- 08 April 2017, pp. 1044-1045
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Microscopy Characterization of Aqueous PVAC Glue Penetration in Double Coated Paperboard Systems
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- 08 April 2017, pp. 1046-1047
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Microanalysis of Silver and Gold Nanoparticles Used in Surface-Enhanced Raman Spectrometric Characterization of Aminobiphenyl Isomers
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- 08 April 2017, pp. 1048-1049
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Shape Controllable Synthesis of ZnO Hexagonal Arrays Via Chemical Precipitation
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- 09 April 2017, pp. 1050-1051
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HRTEM Analysis of Au-Cu Nanoparticles
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- 08 April 2017, pp. 1052-1053
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Characterization of ε and γ′ Produced by Microwave
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- 08 April 2017, pp. 1054-1055
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Advances in Electron Crystallography for Materials Research
Abstract
Being Quantitative in Reciprocal Space
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- 08 April 2017, pp. 1056-1057
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Transmission Diffractive Microscopy Without Lenses at Visible, X-ray and Electron Wavelengths
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- 08 April 2017, pp. 1058-1059
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Electron Diffraction Imaging of Molecular Nanostructures and Molecular Motions
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- 08 April 2017, pp. 1060-1061
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Structural Fingerprinting of Nanocrystals in the Transmission Electron Microscope Supported by Open-Access Crystallographic Databases
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- 08 April 2017, pp. 1062-1063
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Direct Imaging of Rhodium Crystal Surface Structures with Signal Recovery by Low Dose Microscopy
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- 08 April 2017, pp. 1064-1065
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Structural and Chemical Characterisation of Metal and Metal Oxide Nanoparticles
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- 08 April 2017, pp. 1066-1067
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Strain Measurement by Local Diffraction: NanoBeam Electron Diffraction (NBED) Compared to Convergent Beam (CBED) and Dark Holography
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- 08 April 2017, pp. 1068-1069
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Structural Investigations of “Ferecrystals” by Scanning Nanobeam Transmission Electron Diffraction
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- 08 April 2017, pp. 1070-1071
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Diffraction from Oxide Superlattices - Stacking Sequence Effects in Plan View
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- 08 April 2017, pp. 1072-1073
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Crystal Orientation Mapping via STEM/NBD: Improved Quality with Precession Electron Diffraction and Energy Filtering
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- 08 April 2017, pp. 1074-1075
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Reconstruction of Atomic Resolution STEM Images Using the Diffraction-Imaging Method with an Aberration-Corrected STEM
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- 08 April 2017, pp. 1076-1077
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Combining Scanning Transmission Electron Microscopy and Electron Diffraction to Understand the Atomic Structures of Oxide Superlattices
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- 08 April 2017, pp. 1078-1079
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The Influence of Film Thickness on the Microstructure of Nanocrystalline Nickel Films: A Precession Electron Diffraction Microscopy Study
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- 08 April 2017, pp. 1080-1081
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