Instrumentation and Techniques
Optimizing Imaging for Microanalysis: Realizing the Benefits of the New Detector Options
Abstract
Detection of Secondary Electrons by Scintillation Detector at VP SEM
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- 08 April 2017, pp. 922-923
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Construction and Testing of a Dual Faraday Cup for Low Vacuum and Environmental Scanning Electron Microscope
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- 08 April 2017, pp. 924-925
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Helium Ion Microscopy of Cellular Interactions of Nanoparticles
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- 08 April 2017, pp. 926-927
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Design and performance of a Near Ultra High Vacuum Helium Ion Microscope
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- 08 April 2017, pp. 928-929
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High-resolution SEM Imaging with Aberration Correction for Highly Precise Measurement of Semiconductors
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- 09 April 2017, pp. 930-931
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Advances in 3D Electron Microscopy
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Recent Developments in Quantitative Electron Tomography
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- 08 April 2017, pp. 932-933
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Ultra-High Resolution Electron Tomography for Materials Science: a Roadmap
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- 08 April 2017, pp. 934-935
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Characterization of Nickel Oxide Nanoplates Using STEM Tomography and In-situ Electron Microscopy
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- 08 April 2017, pp. 936-937
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3-D Tracking and Visualization of Hundreds of Fuel Cell Nanocatalysts During Electrochemical Aging
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- 08 April 2017, pp. 938-939
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Self-Assembly in Suspension
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- 08 April 2017, pp. 940-941
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3D Imaging of Biological Cells Using a CryoFIB/SEM and a CryoTEM
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- 08 April 2017, pp. 942-943
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Electron Tomography of Quantum Dot Bioconjugates
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- 08 April 2017, pp. 944-945
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3D Characterization of Nano-Pipes and Nano-Pores in Hematite Particles
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- 08 April 2017, pp. 946-947
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Gold Nanoparticles: 3D-STEM-HAADF Analyses and Plasmonic Studies by EELS
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- 08 April 2017, pp. 948-949
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3D STEM for Imaging Biological Samples and Nanoparticles
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- 08 April 2017, pp. 950-951
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STEM Axial Resolution Calculated by Monte Carlo Simulations in Micrometers-Thick Substrates
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- 08 April 2017, pp. 952-953
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Optimized Tomographic Acquisition and Reconstruction for Highly Faceted Nanostructures with Isotropic Resolution
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- 08 April 2017, pp. 954-955
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A New Approach to Electron Tomography for The ATOM Project
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- 08 April 2017, pp. 956-957
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The Tri-Beam System: Femtosecond Laser Based Tomography in a Dual-Beam FIB
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- 08 April 2017, pp. 958-959
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3D EDX Microanalysis by FIB-SEM: Enhancement of Elemental Quantification
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- 09 April 2017, pp. 960-961
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