Microscopy and Microanalysis: Volume 17 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

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Volume 17 - Supplement S2 - July 2011

Contents

Page 23 of 49

Instrumentation and Techniques

Optimizing Imaging for Microanalysis: Realizing the Benefits of the New Detector Options

Abstract

Focused Ion Beam Nano-Tomography Using Different Detectors
M Cantoni, P Burdet, G Knott, C Hébert
Published online by Cambridge University Press:

09 April 2017, pp. 882-883
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Elemental Mapping with SDD-EDS: Solving the Hard Problems
D Newbury, N Ritchie
Published online by Cambridge University Press:

08 April 2017, pp. 884-885
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

New Real Time Visualisations for X-ray Mapping Data
P Statham
Published online by Cambridge University Press:

08 April 2017, pp. 886-887
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Spatial Resolution of X-Ray Images
R Gauvin, P Michaud
Published online by Cambridge University Press:

09 April 2017, pp. 888-889
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

An Investigation of X-ray Mapping/Imaging and the Artifacts Present Using a Silicon Drift Detector - Is Post-Collection Pile-Up Correction Essential?
B Griffin, D Joy, J Michael, J Muhling
Published online by Cambridge University Press:

08 April 2017, pp. 890-891
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

High Speed, High Resolution and Large Area X-ray Imaging Using Silicon Drift Detectors
R Terborg, J Berlin, T Salge
Published online by Cambridge University Press:

09 April 2017, pp. 892-893
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

X-Ray Images with Silicon Drift Detectors
R Anderhalt, T Nylese
Published online by Cambridge University Press:

08 April 2017, pp. 894-895
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

SEMantics for High Speed Automated Particle Analysis by SEM/EDX
N Ritchie, V Filip
Published online by Cambridge University Press:

08 April 2017, pp. 896-897
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Quantitative Chemical Phase Imaging Using Backscattered Electron Imagery, A New Approach
E Vicenzi, A Konicek, C Corrigan
Published online by Cambridge University Press:

08 April 2017, pp. 898-899
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Unconventional Imaging with Backscattered Electrons
I Müllerová, Š Mikmeková, M Hovorka, L Frank
Published online by Cambridge University Press:

08 April 2017, pp. 900-901
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

The Contrast Mechanisms of LL-BSE Electrons in FE-SEM Characterization of Polymer, Single Proteins, and Oxidization States of Elements
H Jaksch
Published online by Cambridge University Press:

08 April 2017, pp. 902-903
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Solid State Backscattered Electron Detector Optimized for Minimum Detectable Energy and Maximum Scan Speed
A Liebel, H Soltau, R Eckhardt, O Jaritschin, A Niculae, F Schopper
Published online by Cambridge University Press:

08 April 2017, pp. 904-905
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

A New Solid State Photomultiplier Device for Electron Imaging
N Barbi, C Piemonte, F Lopour, R Mott
Published online by Cambridge University Press:

08 April 2017, pp. 906-907
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Influence of Backscattered Electron Imaging Geometry on Channeling Contrast of Dislocations
R Kamaladasa, Y Picard
Published online by Cambridge University Press:

08 April 2017, pp. 908-909
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Full Field X-Ray Imaging - Microanalysis between Table Top and Free Electron Laser Experiments
H Soltau, R Hartmann, A Hartmann, P Holl, S Ihle, Ch Thamm, A Liebel, I Ordavo, G Schaller, F Schopper, L Strüder
Published online by Cambridge University Press:

08 April 2017, pp. 910-911
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

STEM Dislocation Analysis and Image Simulations
P Phillips, M Mills, M De Graef
Published online by Cambridge University Press:

08 April 2017, pp. 912-913
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Digital BSE Imaging on SEMs
T Agemura, T Nomaguchi, D Joy
Published online by Cambridge University Press:

09 April 2017, pp. 914-915
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Exploring CCD Camera Parameters with Off-Axis Electron Holography
K Dudeck, E Voelkl, G Botton
Published online by Cambridge University Press:

08 April 2017, pp. 916-917
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Technique for Complex Averaging of Electron Holograms
R McLeod, M Bergen, M Malac
Published online by Cambridge University Press:

08 April 2017, pp. 918-919
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Simulation of Energy Selective signal Amplification in Gas Environment of Variable Pressure SEM
V Nedela, L Konvalina, B Lencová, J Zlámal
Published online by Cambridge University Press:

08 April 2017, pp. 920-921
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 23 of 49

Microscopy and Microanalysis

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Volume 17 - Supplement S2 - July 2011

Instrumentation and Techniques

Optimizing Imaging for Microanalysis: Realizing the Benefits of the New Detector Options

Abstract

Focused Ion Beam Nano-Tomography Using Different Detectors

Elemental Mapping with SDD-EDS: Solving the Hard Problems

New Real Time Visualisations for X-ray Mapping Data

Spatial Resolution of X-Ray Images

An Investigation of X-ray Mapping/Imaging and the Artifacts Present Using a Silicon Drift Detector - Is Post-Collection Pile-Up Correction Essential?

High Speed, High Resolution and Large Area X-ray Imaging Using Silicon Drift Detectors

X-Ray Images with Silicon Drift Detectors

SEMantics for High Speed Automated Particle Analysis by SEM/EDX

Quantitative Chemical Phase Imaging Using Backscattered Electron Imagery, A New Approach

Unconventional Imaging with Backscattered Electrons

The Contrast Mechanisms of LL-BSE Electrons in FE-SEM Characterization of Polymer, Single Proteins, and Oxidization States of Elements

Solid State Backscattered Electron Detector Optimized for Minimum Detectable Energy and Maximum Scan Speed

A New Solid State Photomultiplier Device for Electron Imaging

Influence of Backscattered Electron Imaging Geometry on Channeling Contrast of Dislocations

Full Field X-Ray Imaging - Microanalysis between Table Top and Free Electron Laser Experiments

STEM Dislocation Analysis and Image Simulations

Digital BSE Imaging on SEMs

Exploring CCD Camera Parameters with Off-Axis Electron Holography

Technique for Complex Averaging of Electron Holograms

Simulation of Energy Selective signal Amplification in Gas Environment of Variable Pressure SEM

Microscopy and Microanalysis

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Volume 17 - Supplement S2 - July 2011

Instrumentation and Techniques

Optimizing Imaging for Microanalysis: Realizing the Benefits of the New Detector Options

Abstract