Instrumentation and Techniques
Microanalysis Standards
Abstract
An Investigation of “San Carlos Olivine”: Comparing USNM-distributed Material with Commercially Available Material
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 842-843
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Microanalysis Standards and Instrumental Calibration: Practical Improvements in Analytical Confidence
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- 08 April 2017, pp. 844-845
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The Status of the Smithsonian Microbeam Standards
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- Published online by Cambridge University Press:
- 09 April 2017, pp. 846-847
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A U.S. Geological Survey Round Robin for Microanalytical Techniques
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- 08 April 2017, pp. 848-849
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Discussion of Standard Specimens for Performance Evaluation in Atom Probe Tomography
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- 08 April 2017, pp. 850-851
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Natural Analogs of Synthetic Reference Materials: Assessing the Limits of Homogeneity Testing at the Picogram Scale
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- 08 April 2017, pp. 852-853
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Assessing Microanalytical Performance Using Secondary Standards: Results of an Electron Probe Interlaboratory Comparison Using Four Natural Volcanic Glasses
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- 09 April 2017, pp. 854-855
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EPMA on Copper-Gold Alloys - A CCQM/SAWG Pilot Study
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- 08 April 2017, pp. 856-857
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Bringing Standardized Processes to Atom-Probe Tomography - Part 1: Establishing Standardized Terminology
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- 09 April 2017, pp. 858-859
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MSA/MAS Hyper-Dimensional Spectral File Format - A Straw-Man Proposal
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 860-861
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Applications of Thin-Film Standards in Analytical Electron Microscopy
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 862-863
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Remote & Collaborative Instrument Operation for Research, Teaching and Maintenance
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Remote Nanoimaging on Mars - Results of the Atomic Force Microscope Onboard NASA's Phoenix Mission
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 864-865
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Computer Integrated X-ray Systems and Intelligent Control Systems for Remote Microscopy and Power Savings
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 866-867
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Practical Remote Electron Microscopy - A Vendor's Perspective
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- 09 April 2017, pp. 868-869
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Advanced Microscopic Characterisation through Integrated Learning Tools
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- Published online by Cambridge University Press:
- 09 April 2017, pp. 870-871
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On-Line Scanned Probe Microscopy Transparently Integrated with Twin SEM/FIB Systems
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- 09 April 2017, pp. 872-873
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Remote Viewing of SEM - A Versatile Tool for Failure Analysts and the Materials Community
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- 09 April 2017, pp. 874-875
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Optimizing Imaging for Microanalysis: Realizing the Benefits of the New Detector Options
Abstract
Secondary Electron Imaging - Doing it Better
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- 08 April 2017, pp. 876-877
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Angle and Energy Selective Electron Imaging With an Immersion Lens Cryo-SEM
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 878-879
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Energy Selective Secondary Electron Detection in SEM for the Characterization of Polymers
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- Published online by Cambridge University Press:
- 09 April 2017, pp. 880-881
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