Microscopy and Microanalysis: Volume 17 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Volume 17 - Supplement S2 - July 2011

Contents

Page 21 of 49

Instrumentation and Techniques

Advances in EELS and EFTEM

Abstract

Data Analysis Methods for Modern Analytical Electron Microscopy
M Walls, F de la Peña
Published online by Cambridge University Press:

08 April 2017, pp. 802-803
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Observation of the Hole State Symmetry by Anisotropy of Inelastic Scattering Accompanied by Inner-Shell Excitation
K Saitoh, K Momonoi, N Tanaka
Published online by Cambridge University Press:

08 April 2017, pp. 804-805
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Site-Specific Transition Metal 3d Electron Configurations Studied by Energy Loss with Channeled Electrons
K Tatsumi, S Muto, J Rusz
Published online by Cambridge University Press:

08 April 2017, pp. 806-807
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Simulation of STEM-EELS Including Diffraction and Solid-State Effects I: Mixed Dynamic Form Factor beyond the Dipole Approximation
M Prange, M Oxley, S Pennycook, S Pantelides
Published online by Cambridge University Press:

08 April 2017, pp. 808-809
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Simulation of STEM-EELS Including Diffraction and Solid-State Effects II: Adding the Experiment
M Oxley, M Prange, S Pennycook, S Pantelides
Published online by Cambridge University Press:

08 April 2017, pp. 810-811
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Reciprocal Space Signals Arising from Interference of Core-Loss Electrons in the EMCD Geometry
K Leifer, S Rubino, J Rusz, H Lidbaum, B Hjörvarsson, P Oppeneer, O Eriksson
Published online by Cambridge University Press:

08 April 2017, pp. 812-813
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

A New High Speed, High Resolution 2k x 2k CCD Camera for Transmission Electron Microscopes
Y Jia, B Mollon, P Mooney, M Pan, B McGinn, M Azimi, N Cabilan, A Gubbens, M Lent
Published online by Cambridge University Press:

08 April 2017, pp. 814-815
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Investigating the Optical Properties of Mercury (Hg) Nanoparticles Using CryoSTEM-VEELS
D Anjum, R Sougrat
Published online by Cambridge University Press:

08 April 2017, pp. 816-817
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Identification of DNA and Single Nanoparticles (Qdots) in Muscle Tissue Sections by Low Energy-Loss Electron Spectroscopic Imaging
M Pfannmöller, I Röder, G Benner, I Angert, I Wacker, R Schröder
Published online by Cambridge University Press:

08 April 2017, pp. 818-819
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Phase Detection Using Low-Loss EELS with Aberration Corrected STEM
C Schamp, G Casillas, M Jose-Yacaman
Published online by Cambridge University Press:

08 April 2017, pp. 820-821
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Low Electron Energy Loss Spectroscopy of Fluorescent Probes
R Felts, V Seybold
Published online by Cambridge University Press:

08 April 2017, pp. 822-823
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Advanced Monochromated Low-Voltage EELS and EFTEM
D Bell
Published online by Cambridge University Press:

08 April 2017, pp. 824-825
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Local Atomic Structural Mapping by EELS Spectral Imaging and EXELFS Analysis
P Lu, P Kotula
Published online by Cambridge University Press:

08 April 2017, pp. 826-827
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Atomic-Resolution Imaging and In-situ EELS Study of Ferroelastic and Ferromagnetic Ordering in LaCoO3
T Yuan, N Orlovskaya, R Klie
Published online by Cambridge University Press:

08 April 2017, pp. 828-829
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Study of Al2O3 Nanofibers Dispersed in Al Matrix by EELS and Calculations Ab Initio
V Gallegos-Orozco, A Santos-Beltran, R Martínez-Sánchez, F Paraguay-Delgado, F Espinosa-Magaña
Published online by Cambridge University Press:

08 April 2017, pp. 830-831
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

HAADF and EELS Analysis of Ti Deposited on Si Substrate Prepared by FIB
A Medina-Flores, L Béjar-Gómez, J Rubio-Avalos, J Bernal
Published online by Cambridge University Press:

08 April 2017, pp. 832-833
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Microanalysis Standards

Abstract

Development Strategies for Creating a Suite of Reference Materials for the In-Situ Microanalysis of Non-conventional Raw Materials
A Renno, S Merchel, P Michalak, F Munnik, M Wiedenbeck
Published online by Cambridge University Press:

08 April 2017, pp. 834-835
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

New U-Th-Pb Isotope Reference Material for SIMS
A Kennedy
Published online by Cambridge University Press:

08 April 2017, pp. 836-837
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

ASTM Grain Size by EBSD - A New Standard
J Friel, S Wright, S Sitzman
Published online by Cambridge University Press:

08 April 2017, pp. 838-839
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Developing Standard Reference Materials for Analytical Electron Microscopy
E Steel, J Davis, A Herzing
Published online by Cambridge University Press:

08 April 2017, pp. 840-841
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 21 of 49

Microscopy and Microanalysis

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Volume 17 - Supplement S2 - July 2011

Instrumentation and Techniques

Advances in EELS and EFTEM

Abstract

Data Analysis Methods for Modern Analytical Electron Microscopy

Observation of the Hole State Symmetry by Anisotropy of Inelastic Scattering Accompanied by Inner-Shell Excitation

Site-Specific Transition Metal 3d Electron Configurations Studied by Energy Loss with Channeled Electrons

Simulation of STEM-EELS Including Diffraction and Solid-State Effects I: Mixed Dynamic Form Factor beyond the Dipole Approximation

Simulation of STEM-EELS Including Diffraction and Solid-State Effects II: Adding the Experiment

Reciprocal Space Signals Arising from Interference of Core-Loss Electrons in the EMCD Geometry

A New High Speed, High Resolution 2k x 2k CCD Camera for Transmission Electron Microscopes

Investigating the Optical Properties of Mercury (Hg) Nanoparticles Using CryoSTEM-VEELS

Identification of DNA and Single Nanoparticles (Qdots) in Muscle Tissue Sections by Low Energy-Loss Electron Spectroscopic Imaging

Phase Detection Using Low-Loss EELS with Aberration Corrected STEM

Low Electron Energy Loss Spectroscopy of Fluorescent Probes

Advanced Monochromated Low-Voltage EELS and EFTEM

Local Atomic Structural Mapping by EELS Spectral Imaging and EXELFS Analysis

Atomic-Resolution Imaging and In-situ EELS Study of Ferroelastic and Ferromagnetic Ordering in LaCoO3

Study of Al2O3 Nanofibers Dispersed in Al Matrix by EELS and Calculations Ab Initio

HAADF and EELS Analysis of Ti Deposited on Si Substrate Prepared by FIB

Microanalysis Standards

Abstract

Development Strategies for Creating a Suite of Reference Materials for the In-Situ Microanalysis of Non-conventional Raw Materials

New U-Th-Pb Isotope Reference Material for SIMS

ASTM Grain Size by EBSD - A New Standard

Developing Standard Reference Materials for Analytical Electron Microscopy

Microscopy and Microanalysis

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Volume 17 - Supplement S2 - July 2011

Instrumentation and Techniques

Advances in EELS and EFTEM

Abstract

Microanalysis Standards

Abstract